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In-situ electrical and spectroscopical techniques for the study of degradation mechanisms and life time prediction of organic based electronic material systems

Published online by Cambridge University Press:  15 February 2011

Jean Manca
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium IMEC, division IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Ludwig Goris
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Els Kesters
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Laurence Lutsen
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium IMEC, division IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Tom Martens
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Ken Haenen
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Milos Nesladek
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Ornella Sanna
Affiliation:
University of Cagliari, Piazza d'Armi, I-09123 Cagliari, Italy
Dirk Vanderzande
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium IMEC, division IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Jan D'Haen
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium IMEC, division IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
Luc De Schepper
Affiliation:
Institute for Materials Research, Limburgs Universitair Centrum, Wetenschapspark 1, B-3590 Diepenbeek, Belgium IMEC, division IMOMEC, Wetenschapspark 1, B-3590 Diepenbeek, Belgium
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Abstract

In order to tailor the synthesis of new robust organic materials for electronic applications and to guarantee the required life time for the emerging commercial plastic electronic applications it is of key importance to understand the underlying degradation mechanisms. Since plastic electronics is a rather young technology introducing new material systems, its reliability is characterized by new failure and degradation mechanisms, a relatively high amount of early failures and multi-modal failure distributions. To understand the mechanism responsible for a given failure or degradation mode, it is essential to study it separately, through appropriate test structures and test techniques. Powerful techniques for this purpose are a.o. analytical techniques (SEM, TEM, SPM,…), in-situ electrical measurement techniques and spectroscopical techniques (in-situ FTIR, in-situ UV-Vis, PDS). The benefits of these in-situ techniques in the reliability study of organic based electronics will be illustrated in this contribution.

Type
Research Article
Copyright
Copyright © Materials Research Society 2003

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References

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