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In-Situ Characterization of Growth and Intermixing at a Heteroepitaxial Interface: Fe on Au(001)

Published online by Cambridge University Press:  21 February 2011

Q. Jiang ,
A. Chan ,
Y.-L. He  and
G.-C. Wang
Q. Jiang
Affiliation:
Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180-3590
A. Chan
Affiliation:
Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180-3590
Y.-L. He
Affiliation:
Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180-3590
G.-C. Wang
Affiliation:
Department of Physics, Rensselaer Polytechnic Institute, Troy, NY 12180-3590
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Abstract

The growth and chemical intermixing of submonolayer and a few monolayer thick Fe films on a Au(001) surface was studied by High Resolution Low Energy Electron Diffraction (HRLEED) technique. Through the analysis of the energy dependent angular profiles as a function of time, we obtained the distribution of islands and distribution of spacings during submonolayer growth. The interference of electron waves from different chemical elements in terraces at different heights in the surface contributes to the background intensity and broadening in the angular profiles of diffraction beams. A subsurface Fe capped by Au islands as a result of atomic place exchange was observed at the initial stage of monolayer growth. From the energy dependent angular profiles as a function of temperature, we determine the quantitative change of inhomogeneity length (∼20 Å) at the interface of ultrathin films at elevated temperatures due to intermixing.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 318: Symposium Ca – Interface Control of Electrical, Chemical, and Mechanical Properties , 1993 , 13
Copyright
Copyright © Materials Research Society 1994

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References

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