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In-Situ 1Mev Tem and Hrem Study of the Deformation and the Transformation of Symmetrical Tilt Grain Boundaries in Ge and Si.
Published online by Cambridge University Press: 21 February 2011
Abstract
The evolution under deformation of symmetrical GBs in Si and Ge has been studied both by in-situ TEM and HREM. The influence of the strain conditions (tension or compression) on the final structure through the entrance of different types of dislocations will be discussed. The influence of the deformation temperature on the multiplicity of the structures has been observed in a particular range of misorientation angles.
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- Copyright © Materials Research Society 1994