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In-Situ 1Mev Tem and Hrem Study of the Deformation and the Transformation of Symmetrical Tilt Grain Boundaries in Ge and Si.

Published online by Cambridge University Press:  21 February 2011

Jany. Thibault ,
X. Baillin ,
J. Pelissier ,
J.L. Putaux  and
H.M. Michaud
Jany. Thibault
Affiliation:
CEA/Département de Recherche Fondamentale sur la Matière Condensée/SP2M, Centre d'Etudes Nucléaires, 38054 Grenoble-cedex 9, France member of the CNRS
X. Baillin
Affiliation:
CEA/CEREM/Département d'Etudes des Matériaux, Centre d'Etudes Nucléaires, 38054 Grenoble-cedex 9, France
J. Pelissier
Affiliation:
CEA/CEREM/Département d'Etudes des Matériaux, Centre d'Etudes Nucléaires, 38054 Grenoble-cedex 9, France
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Abstract

The evolution under deformation of symmetrical GBs in Si and Ge has been studied both by in-situ TEM and HREM. The influence of the strain conditions (tension or compression) on the final structure through the entrance of different types of dislocations will be discussed. The influence of the deformation temperature on the multiplicity of the structures has been observed in a particular range of misorientation angles.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 319: Symposia CB – Defect-Interface Interactions , 1993 , 215
Copyright
Copyright © Materials Research Society 1994

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References

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