Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Nemanich, R. J.
Stafford, B. L.
Abelson, J. R.
and
Sigmon, T. W.
1985.
Proceedings of the 17th International Conference on the Physics of Semiconductors.
p.
155.
Nemanich, R. J.
Fulks, R. T.
Stafford, B. L.
and
Vander Plas, H. A.
1985.
Reactions of thin-film titanium on silicon studied by Raman spectroscopy.
Applied Physics Letters,
Vol. 46,
Issue. 7,
p.
670.
Nemanich, R. J.
Doland, C. M.
Fulks, R. T.
and
Ponce, F. A.
1985.
Initial Nucleation and the Effects on Epitaxial Silicide Formation.
MRS Proceedings,
Vol. 54,
Issue. ,
Abelson, John R.
and
Sigmon, Thomas W.
1986.
Atomic Registry at the Pt-Si Interface Studied by Transmission Channeling RBS.
MRS Proceedings,
Vol. 77,
Issue. ,
Nemanich, R. J.
Doland, C. M.
and
Ponce, F. A.
1987.
The Initial Stages of Silicide Epitaxy - Nucleation and Morphology.
MRS Proceedings,
Vol. 94,
Issue. ,
Samhita Dasgupta, Samhita Dasgupta
Kumar, Sandeep
Jackson, Howard E.
and
Boyd, Joseph T.
1987.
Raman Scattering from Rapid Thermally Annealed Tungsten Silicide.
MRS Proceedings,
Vol. 92,
Issue. ,
Kumar, Sandeep
Dasgupta, Samhita
Jackson, Howard E.
and
Boyd, Joseph T.
1987.
Raman scattering from rapid thermally annealed tungsten silicide.
Applied Physics Letters,
Vol. 50,
Issue. 6,
p.
323.
Nemanich, R.J.
Fiordalice, R.W.
and
Jeon, H.
1989.
Raman scattering characterization of titanium silicide formation.
IEEE Journal of Quantum Electronics,
Vol. 25,
Issue. 5,
p.
997.
Kawadzu, Yunosuke
Iloka, Mitsuru
Fujii, Americo
Oyanagi, Hiroyuki
and
Arai, Toshihiro
1990.
Interfacial reaction of nickel/hydrogenated amorphous silicon system at low temperature studied by fluorescence exafs.
Applied Surface Science,
Vol. 41-42,
Issue. ,
p.
296.
Donthu, S. K.
Chi, D. Z.
Wong, A. S. W.
Chua, S. J.
and
Tripathy, S.
2002.
Micro-raman spectroscopic investigation of NiSi films formed on BF2+-, B+-and nonimplanted (100) Si substrates.
MRS Proceedings,
Vol. 716,
Issue. ,
Donthu, S.K.
Chi, D.Z.
Tripathy, S.
Wong, A.S.W.
and
Chua, S.J.
2004.
Micro-Raman spectroscopic investigation of NiSi films formed on BF2 +-, B+- and non-implanted (100)Si substrates.
Applied Physics A,
Vol. 79,
Issue. 3,
p.
637.
Wan, Li
Ren, Yiming
Tang, Bo
Cheng, Xinhong
Zhang, Xuefei
Xu, Dapeng
Luo, Hijun
and
Huang, Yunmi
2009.
Polarized Raman spectroscopy study of NiSi film grown on Si(001) substrate.
Applied Physics A,
Vol. 97,
Issue. 3,
p.
693.
Wan, Li
Tang, Bo
Cheng, Xinhong
Ren, Yiming
Zhang, Xuefei
Xu, Dapeng
Luo, Haijun
and
Huang, Yunmi
2009.
Raman active modes of NiSi crystal.
Physica B: Condensed Matter,
Vol. 404,
Issue. 16,
p.
2324.
Wan, Li
Zhang, Xuefei
Tang, Bo
Ren, Yiming
Cheng, Xinhong
Xu, Dapeng
Luo, Hijun
and
Huang, Yunmi
2010.
Effects of Laser in situ annealing on crystal quality of NiSi film grown on Si(001) substrate.
Thin Solid Films,
Vol. 518,
Issue. 14,
p.
3646.
Piao, Yinghua
Zhu, Zhiwei
Gao, Xindong
Karabko, Aliaksandra
Hu, Cheng
Qiu, Zhijun
Luo, Jun
Zhang, Zhi-Bin
Zhang, Shi-Li
and
Wu, Dongping
2012.
Extensive Raman spectroscopic investigation of ultrathin Co1−xNixSi2 films grown on Si(100).
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films,
Vol. 30,
Issue. 4,
Nazarudin, Nur Fatin Farhanah Binti
Rizan, Nastaran
Periasamy, Vengadesh
Abdul Rahman, Saadah
and
Goh, Boon Tong
2019.
Physical, optical and electrical studies on hybrid Ag NPs/NiSi NWs electrode as a DNA template for biosensor.
Materials Research Express,
Vol. 6,
Issue. 9,
p.
095039.
Preeti, Preeti
Naidu, K. Lakshun
Krishna, M. Ghanashyam
and
Mohiddon, Mahamad Ahamad
2021.
Investigation of Crystallographic Changes Across the Cr/ <i>a</i>-Si Interface by X-Ray Absorption Spectroscopy.
SSRN Electronic Journal ,
Preeti
Naidu, K. Lakshun
Krishna, M. Ghanashyam
and
Mohiddon, Md Ahamad
2022.
Investigation of crystallographic changes across the Cr/a-Si interface by X-ray absorption spectroscopy.
Applied Surface Science,
Vol. 592,
Issue. ,
p.
153204.
Utamuradova, Sh.B.
Daliev, Sh.Kh
Stanchik, A.V.
Rakhmanov, D.A.
Tanaino, I.
and
Dzholdosheva, T.
2023.
Raman spectroscopy of silicon, doped with platinum and irradiated by protons.
E3S Web of Conferences,
Vol. 402,
Issue. ,
p.
14014.
Utamuradova, Sharifa B.
Daliev, Khojakbar S.
Khaitbaev, Alisher I.
Khamdamov, Jonibek J.
Zarifbayev, Jasur Sh.
and
Alikulov, Bekzod Sh.
2024.
Defect Structure of Silicon Doped with Erbium.
East European Journal of Physics,
p.
288.