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Influence of The Growth Temperature on The Presence of Composition Inhomogeneities in In0.52Al0.48As Layers Grown by MBE on InP Substrates
Published online by Cambridge University Press: 25 February 2011
Abstract
By using Transmission Electron Microscopy we have studied the presence of composition inhomogeneities in In0.52Al0.48As layers grown on (100) InP. We have found a critical temperature equal to 550°C above which composition inhomogeneities start to appear nonuniformly distributed over the sample area. However, as the growth temperature increases they cover the whole layer. Furtermore, the density of stacking faults and threading dislocations increases for growth temperatures beyond the optimum value of 530°C.
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