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Influence of Layer Structure on Antiferromagnetic Exchange Coupling of Iron Films through Chromium Interlayers

Published online by Cambridge University Press:  26 February 2011

A.P. Payne
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
H. Kataoka
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
M. Farle
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
B.M. Clemens
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA, 94305-2205
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Abstract

The effect of layer structure perturbations on antiferromagnetic coupling in Fe-Cr-Fe trilayer systems is investigated. By varying the sputtering pressure, the layer structure of Fe-Cr-Fe trilayers is systematically altered, as indicated by changes in the low angle superlattice spectra of multilayers fabricated under identical conditions. The effect of topographic roughness is investigated by fabricating identical trilayers on Cr buffer layers of different thickness. Scanning tunneling microscopy is used to measure surface roughness. In each case the saturation field is measured as a function of Cr interlayer thickness by means of tapered Cr interlayer structures in which the thickness of the spacer varies linearly from 0 to 28 Å upon a single substrate. Antiferromagnetic coupling is measured locally by means of the magneto-optic Kerr effect. Results show that although the coupling is diminished by structural perturbations, it is a remarkably robust effect which persists even in instances of poor layer structure.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

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