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Influence of Environment on Excimer Laser Irradiation of Metals

Published online by Cambridge University Press:  28 February 2011

Julian P. Partridge ,
Joseph Pellegrino ,
Craig Murphy  and
Peter R. Strutt
Julian P. Partridge
Affiliation:
The University of Connecticut, Institute of Materials Science, Box U-136, Storrs, CT 06268.
Joseph Pellegrino
Affiliation:
The University of Connecticut, Institute of Materials Science, Box U-136, Storrs, CT 06268.
Craig Murphy
Affiliation:
The University of Connecticut, Institute of Materials Science, Box U-136, Storrs, CT 06268.
Peter R. Strutt
Affiliation:
The University of Connecticut, Institute of Materials Science, Box U-136, Storrs, CT 06268.
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Abstract

Irradiation of metals in gaseous and liquid nitrogen by KrF excimer laser pulses shows the way in which vapor or plasma pressure fields determine the nature of the rapidly solidified surface topography. Wave patterns formed on aluminum by irradiation in N2 gas arise from recoil pressure differences produced by highly localised differential surface evaporation. The solidification time, calculated from the observed ripple wavelength, is in good agreement with that deduced from a heat flow calculation. For irradiation in liquid N2, the homogeneous pressure within the center of the dense plasma zone results in a smooth surface. Beyond this region the progressively diminishing pressure induces surface ripples, fragmentation and droplet formation. Intriguingly, immersion of Ni, Ti, Zn, and Al in liquid N2 (to a depth of 2 to 4 mm) considerably increases the area and depth of irradiation-modified regions.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 74: Symposium A – Beam-Solid Interactions and Transient Processes , 1986 , 173
Copyright
Copyright © Materials Research Society 1987

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References

1. Pirri, A.N., Root, R.G., and Wu, P.K.S., AIAA Journal, 16 (12), 1296 (1978).CrossRefGoogle Scholar
2. Ursu, I., Mihailescu, I.N., Popa, A., Prokhorov, A.M., Ageev, V.P., Gorbunov, A.A., and Konov, V.I., J. Appl. Phys. 58 (10), 3909 (1985).CrossRefGoogle Scholar
3. Bell, C.E. and Landt, J.A., Appl. Phys. Lett. 10 (2), 46 (1967).Google Scholar
4. Lyamshev, L.M., Uspekhi Fizicheskih Nauk. 135, 637 (1981).CrossRefGoogle Scholar
5. Nakamura, K., Hikta, M., Asano, H. and Terada, A., Jap. J. Appl. Phys. 21 (40), 673 (1982).Google Scholar
6. Veiko, V.P. and Tuchkova, E.A., Phys. Chem. Mech. Surfaces 2 (5), 1260 (1984).Google Scholar
7. Zahlenwerte und Funktionen aus Physik, Chemie, Astronomie, und Technik. Landolt-Bornstein. (Springer-Verlag, Berlin, 1962), pp 1–1 to 1–42.Google Scholar
8. Woodroffe, J.A., Hsia, J., and Ballantyne, A., Appl. Phys. Lett. 36 (1), 14 (1980).Google Scholar
9. Brueck, S.R.J. and Kildal, H., J. Appl. Phys. 52 (2), 1004 (1981).CrossRefGoogle Scholar