Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-05T02:57:29.018Z Has data issue: false hasContentIssue false
  • English
  • Français

Influence of Electron Beam Irradiation on The Nucleation of Fine Water Drops on Misted Silicate (SiO2) Glass

Published online by Cambridge University Press:  15 February 2011

K. Oguri ,
K. Sato ,
T. Izumi ,
A. Tonegawa ,
K. Takayama  and
Y. Nishi
K. Oguri
Affiliation:
Department of Physics, Tokai University, Hiratsuka, Kanagawa, 259-1292, Japan
K. Sato
Affiliation:
Department of electronics, Tokai University, Hiratsuka, Kanagawa, 259-1292, Japan
T. Izumi
Affiliation:
Department of electronics, Tokai University, Hiratsuka, Kanagawa, 259-1292, Japan
A. Tonegawa
Affiliation:
Department of Physics, Tokai University, Hiratsuka, Kanagawa, 259-1292, Japan
K. Takayama
Affiliation:
Honorary Professor of Tokai University, Hiratsuka, Kanagawa, 259-1292, Japan
Y. Nishi
Affiliation:
Department of Materials Science, Tokai University, Hiratsuka, Kanagawa, 259-1292, Japan
Get access

Abstract

By using an electron beam irradiation, reproducible active surface condition of misting can be obtained on the silicate glass. Since an electron beam irradiation activates the SiO2 surface, it controls and enhances the nucleation frequency of fine water drops. The dangling bond is one of reasons to activate the surface condition. Based on the results of electron spin resonance (ESR) spectra, the electron beam irradiation increases the density of E'-center on the surface.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 540: Symposium N / Microstructural Processes in Irradiated Materials , 1998 , 261
Copyright
Copyright © Materials Research Society 1999

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Inoue, N., Kikuchi, M., Manabe, T., Shima, T. and Nishi, Y., Nucl. Instrum. Methods B, 59/60, 1328 (1991).Google Scholar
2. Inoue, N., Kikuchi, M., Shima, T., Iwase, M. and Nishi, Y., Phys. Lett. A, 157, 299 (1991).Google Scholar
3. Nishi, Y., Takagi, S., Yasuda, K. and Itoh, K., J. Appl. Phys. 70, 367 (1991).Google Scholar
4. Shibukawa, Y., Iwataka, N., Kawano, J., Nishi, Y. and Tonegawa, A., J. Adv. Sci. 9, 144 (1997).Google Scholar
5. Oguri, K., Fujita, K., Takahashi, M., Omori, Y., Tonegawa, A., Honda, N., Ochi, M., Takayama, K. and Nishi, Y., J.Mater. Res. 13, 3368 (1998).Google Scholar
6. Nishi, Y., Takagi, S., Yasuda, K., Itoh, K. and Kawakami, M., Nucl. Instrum. Methods B, 59/60,1422 (1991)Google Scholar
7. Young, T., Trans. Roy. Sco., London, 95, 84 (1805).Google Scholar
8. Griscom, D.L., Friebele, E.J., Rad. Effects, 65, 63 (1982).Google Scholar
9. Griscom, D.L., The Centennial Memorial Issue of the Ceramic Soc. Jpn, 99, 923 (1991).Google Scholar