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Incomplete Crystallization of Skutterudites

Published online by Cambridge University Press:  01 February 2011

Arwyn L. E. Smalley  and
David C. Johnson
Arwyn L. E. Smalley
Affiliation:
[email protected], Norwich University, Chemistry, 158 Harmon Dr., Northfield, VT, 05663, United States, 802-485-2354
David C. Johnson
Affiliation:
[email protected], University of Oregon, Chemistry, United States
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Abstract

A series of CexCo4Sb12 samples were synthesized, with x = 0 to 2. The crystallinity of the samples was studied using quantitative Rietveld analysis, and revealed that the samples did not crystallize completely. These data correlated with changes in the lattice parameter, DSC peak temperature, and DSC peak area. The crystallinity was confirmed using electron back-scatter diffraction (EBSD), which showed crystallites with a background of an amorphous matrix. This unusual morphology may improve thermoelectric properties by decreasing thermal conductivity.

Keywords

thermoelectricitycrystal growthx-ray diffraction (XRD)
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 886: Symposium F – Materials and Technologies fore Direct Thermal-to-Electric Energy Conversion , 2005 , 0886-F09-12
Copyright
Copyright © Materials Research Society 2006

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References

REFERENCES

1. Sellinschegg, H., Smalley, A., Yoon, G., Johnson, D. C., Nolas, G. S., Kaeser, M., and Tritt, T. M., Proceedings from the International Conference on Thermoelectrics, 18th, 352–355 (1999).Google Scholar
2. Smalley, A. L. E., Howe, B., and Johnson, D. C., Materials Research Symposium Proceedings 793, 413 (2004).Google Scholar
3. Fister, L., Li, X.-M., McConnell, J., Novet, T., and Johnson, D. C., Journal of Vacuum Science Technology A 11, 3014–3019 (1993).Google Scholar
4. Sellinschegg, H., Johnson, D. C., Nolas, G. S., Slack, G. A., Schujman, S. B., Mohammed, F., Tritt, T., and Nelson, E., Proceedings from the International Conference on Thermoelectrics 17th, 338–341 (1998).Google Scholar
5. Morelli, D. T., Meisner, G. P., Chen, B., Hu, S., and Uher, C., Physical Review B 56, 7376–7383 (1997).Google Scholar
6. Takizawa, H., Miura, K., Ito, M., Suzuki, T., and Endo, T., Journal of Alloys and Compounds 282, 79–83 (1999).Google Scholar
7. Takizawa, H., Okazaki, K., Uheda, K., Endo, T., and Nolas, G. S., Proceedings from the Materials Research Symposium 691, 37–47 (2002).Google Scholar