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In Situ Study of Zirconia Stabilization by Anion Exchange (N for O) Using High-Temperature, Controlled Atmosphere Electron Diffraction

Published online by Cambridge University Press:  10 February 2011

Renu Sharma ,
Eberhard Schweda  and
Dirk Naedele
Renu Sharma
Affiliation:
Center for Solid State Science Arizona State University, Tempe AZ 85287
Eberhard Schweda
Affiliation:
Anorganische Chemie, Universität Tùibingen Auf Morgenstelle 18, Tilbingen D- 72076 Germany
Dirk Naedele
Affiliation:
Anorganische Chemie, Universität Tùibingen Auf Morgenstelle 18, Tilbingen D- 72076 Germany
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Abstract

Stabilization of zirconia by anion exchange (N for O) is a novel idea. A number of oxy-nitrides with flourite-related (cubic) structure have been reported to form at high temperatures (1100°C). We have used a TEM equipped with environmental cell and Gatan Imaging Filter (GIF) to study the nitridation behavior of zirconia. The in situ observations reveal the formation of a cubic structure at ≈800°C when the Zr(OH) 4×H2O precursor was heated in ≈2 torr of NH3. The presence of N in the lattice is confirmed by electron energyloss spectroscopy.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 135
Copyright
Copyright © Materials Research Society 2001

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References

[1] Howard, C.J., and Hill, R.J., J. Mat. Sci., 26 (1991) 127.Google Scholar
[2] Garvie, R.C., J. Phys. Chem., 82(2) (1978) 218.Google Scholar
[3] Grain, C.F., J. Am. Ceram. Soc., 50(6) (1967) 288.Google Scholar
[4] Sharma, R., McKelvy, M., and Lajavardi, M., Electron Microscopy, 2 (1992)463.Google Scholar
[5] Gilles, J.C., Rev. Hautes Temp. Refract., 2 (1965)237.Google Scholar
[6] Lerch, Martin, J. Am. Ceram. Soc., 79(10) (1996) 2641.Google Scholar
[7] Rossel, H.J., Adv. Ceramics, 3 (1981), 47.Google Scholar
[8] Sharma, Renu and Weiss, Karl, Microscopy Research and Techniques, 42 (1998) 270–280.Google Scholar