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In Situ Measurement of the Second Harmonic Signal of Adsorbing Nonlinear Optical Ionically Self-assembled Monolayers

Published online by Cambridge University Press:  17 March 2011

C. Brands
Affiliation:
Department of Physics, Virginia Tech Blacksburg, VA 24061
P.J. Neyman
Affiliation:
Department of Materials Science and Engineering, Virginia Tech Blacksburg, VA 24061
M.T. Guzy
Affiliation:
Department of Chemical Engineering, Virginia Tech Blacksburg, VA 24061
S. Shah
Affiliation:
Department of Chemical Engineering, Virginia Tech Blacksburg, VA 24061
K.E Van Cott
Affiliation:
Department of Chemical Engineering, Virginia Tech Blacksburg, VA 24061
R.M. Davis
Affiliation:
Department of Chemical Engineering, Virginia Tech Blacksburg, VA 24061
H. Wang
Affiliation:
Department of Chemistry, Virginia Tech Blacksburg, VA 24061
H.W. Gibson
Affiliation:
Department of Chemistry, Virginia Tech Blacksburg, VA 24061
J.R. Heflin
Affiliation:
Department of Physics, Virginia Tech Blacksburg, VA 24061
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Abstract

Ionically self-assembled monolayers (ISAMs) have recently been shown to spontaneously exhibit a polar ordering that gives rise to substantial second order nonlinear optical response. The deposition of ISAMs has been studied in situ via second harmonic generation. This is a particularly sensitive probe of the growth of nanometer-thick films since the centrosymmetry of the immersion solutions, the substrate, and the container yields no SHG contribution from these bulk components. Upon immersion in the NLO-active polyelectrolyte solution, the SHG rises sharply over the first minute. When a film is immersed into salt water, the SHG decreases significantly only to be restored when the salt solution is replaced with deionized water.

Type
Research Article
Copyright
Copyright © Materials Research Society 2002

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References

REFERENCES

1. Decher, G., Hong, J.D., and Schmitt, J., Thin Solid Films 210, 831 (1992).Google Scholar
2. Decher, G., Science 277, 1232 (1997).Google Scholar
3. Heflin, J.R., Figura, C., Marciu, D., Liu, Y., and Claus, R.O., SPIE Proc. 3147, 10(1997); Appl. Phys. Lett. 74, 595 (1999).Google Scholar
4. Lvov, Y., Yamada, S., and Kunitake, T., Thin Solid Films 300, 107(1997).Google Scholar
5. Wang, X., Balasubramanian, S., Li, L., Jiang, X., Sandman, D.. Rubner, M.F., Kumar, J., and Tripathy, S.K., Macromol. Rapid Commun. 18, 451 (1997).Google Scholar
6. Roberts, M.J., Lindsay, G.A., Herman, W.N., and Whynne, K.J., J. Am. Chem. Soc. 120, 11202(1998).Google Scholar
7. Figura, C., Neyman, P.J., Marciu, D., Brands, C., Murray, M.A., Hair, S., Miller, M.B., Davis, R.M., and Heflin, J.R.. MRS Proc. vol. 598, BB4.9.16(2000).Google Scholar
8. Brands, C., Heflin, J.R., Neyman, P.J., Guzy, M. T., Shah, S., Gibson, H. W., Cott, K. E. Van, Davis, R. M., SPIE Proc. 4461, 311 (2001).Google Scholar
9. Neyman, P.J., Guzy, M.T., Shah, S., Wang, H., Gibson, H.W., Cott, K. E. Van, Davis, R.M., Brands, C., Heflin, J.R., (this proceedings).Google Scholar