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In Situ Diagnostics of Nanomaterial Synthesis by Laser Ablation: Time-resolved Photoluminescence Spectra and Imaging of Gas-Suspended Nanoparticles Deposited for Thin Films

Published online by Cambridge University Press:  09 August 2011

D. B. Geohegan ,
A. A. Puretzky ,
A. Meldrum ,
G. Duscher  and
S. J. Pennycook
D. B. Geohegan
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056 [email protected]
A. A. Puretzky
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056 [email protected]
A. Meldrum
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056 [email protected]
G. Duscher
Affiliation:
MPI für Metallforschung, Institut für Werkstoffwissenschaft, Seestr. 92, D-70174 Stuttgart
S. J. Pennycook
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6056 [email protected]
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Abstract

The dynamics of nanoparticle formation by laser ablation into background gases are revealed by gated-ICCD photography of photoluminescence (PL) and Rayleigh-scattering (RS) from gas-suspended nanoparticles. These techniques, along with gated-spectroscopy of PL from isolated, gassuspended nanoparticles, permit fundamental investigations of nanomaterial growth, doping, and luminescence properties prior to deposition for thin films. Using the time-resolved diagnostics, particles unambiguously formed in the gas phase were collected on TEM grids. Silicon nanoparticles, 1-10 nm in diameter, were deposited following laser ablation into 1-10 TorrAror He. Three in situ PL bands (1.8, 2.6, 3.2 eV) similar to oxidized porous silicon were measured, but with a pronounced vibronic structure. Structureless photoluminescence bands were reproduced in the films (2.1, 2.7, 3.2 eV) only after standared annealing. The ablation of metal zinc into Ar/02 is also reported for the preparation of < 10 nm diameter hexagonal zincite nanocrystals, The particles were analyzed by bright field and Z-contrast TEM and high resolution EELS.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 536: Symposium F – Microcrystalline & Nanocrystalline Semiconductors - 1998 , 1998 , 359
Copyright
Copyright © Materials Research Society 1999

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