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In situ coupling of atomic force microscopy and sub-micrometer focused X-ray techniques

Published online by Cambridge University Press:  14 October 2014

Thomas W. Cornelius ,
Zhe Ren ,
Francesca Mastropietro ,
Simon Langlais ,
Anton Davydok ,
Marie-Ingrid Richard ,
Maxime Dupraz ,
Marc Verdier ,
Guillaume Beutier  and
Peter Boesecke
...Show all authors
Thomas W. Cornelius
Affiliation:
Aix Marseille University, CNRS, IM2NP UMR 7334, 13397 Marseille Cedex, France
Zhe Ren
Affiliation:
Aix Marseille University, CNRS, IM2NP UMR 7334, 13397 Marseille Cedex, France
Francesca Mastropietro
Affiliation:
Aix Marseille University, CNRS, IM2NP UMR 7334, 13397 Marseille Cedex, France
Simon Langlais
Affiliation:
SIMaP, Grenoble Institute of Technology & CNRS, 38402 Saint-Martin d'Hères Cedex, France.
Anton Davydok
Affiliation:
Aix Marseille University, CNRS, IM2NP UMR 7334, 13397 Marseille Cedex, France
Marie-Ingrid Richard
Affiliation:
Aix Marseille University, CNRS, IM2NP UMR 7334, 13397 Marseille Cedex, France European Synchrotron Radiation Facility (ESRF), 38043 Grenoble Cedex, France
Maxime Dupraz
Affiliation:
SIMaP, Grenoble Institute of Technology & CNRS, 38402 Saint-Martin d'Hères Cedex, France.
Marc Verdier
Affiliation:
SIMaP, Grenoble Institute of Technology & CNRS, 38402 Saint-Martin d'Hères Cedex, France.
Guillaume Beutier
Affiliation:
SIMaP, Grenoble Institute of Technology & CNRS, 38402 Saint-Martin d'Hères Cedex, France.
Peter Boesecke
Affiliation:
European Synchrotron Radiation Facility (ESRF), 38043 Grenoble Cedex, France
Olivier Thomas
Affiliation:
Aix Marseille University, CNRS, IM2NP UMR 7334, 13397 Marseille Cedex, France
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Abstract

A scanning force microscope for in situ nanofocused X-ray studies (SFINX) has been developed which can be installed on diffractometers at synchrotron beamlines allowing for the combination with various techniques such as coherent X-ray diffraction and fluorescence. The capabilities of this device are demonstrated on Cu nanowires and on Au islands grown on sapphire (0001). The sample topography, crystallinity, and elemental distribution of the same area are investigated by recording simultaneously an AFM image, a scanning X-ray diffraction map, and a fluorescence map. Additionally, the mechanical response of Au islands is studied by in situ indentation tests employing the AFM-tip and recording 2D X-ray diffraction patterns during mechanical loading.

Keywords

x-ray diffraction (XRD)scanning probe microscopy (SPM)nanostructure
Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 1712: Symposium ZZ/AAA/BBB – Recent Advances in the Structural Characterization of Materials , 2014 , mrss14-1712-aaa11-03
Copyright
Copyright © Materials Research Society 2014 

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References

REFERENCES

Uchic, M.D., Dimiduk, D.M., Florando, J.N., Nix, W.D., Science 305, 986 (2004).CrossRefGoogle Scholar
Bei, H., Shim, S., George, E., Miller, M., Herbert, E., Pharr, G., Scripta Mater. 57, 397 (2007).CrossRefGoogle Scholar
Richter, G. et al. ., Nano Letters 9, 3048 (2009).CrossRefGoogle Scholar
Kiener, D., Grosinger, W., Dehm, G., Pippan, R., Acta Materialia 56, 580 (2008).CrossRefGoogle Scholar
Chen, L.Y., Richter, G., Sullivan, J.P., Gianola, D.S., Phys. Rev. Lett. 109, (2012).Google Scholar
Minor, A.M., Morris, J.W., Stach, E.A., Appl. Phys. Lett. 79, 1625 (2001).CrossRefGoogle Scholar
Maaß, R., van Petegem, S., Borca, C., van Swygenhoven, H., Mat. Sci. Eng. A 524, 40 (2009)CrossRefGoogle Scholar
Kirchlechner, C. et al. ., Acta Mater. 60, 1252 (2012).CrossRefGoogle Scholar
Scheler, T. et al. ., Appl. Phys. Lett. 94, 023109 (2009).Google Scholar
Rodrigues, M.S. et al. ., J. Instrum. 3, 12004 (2008).CrossRefGoogle Scholar
Rodrigues, M.S. et al. ., J. Appl. Phys. 106, 103525 (2009).CrossRefGoogle Scholar
Beutier, G. et al. ., J. Phys. Conf. Ser. 425, 132003 (2013).CrossRefGoogle Scholar
Sadan, H., Kaplan, W., J. Mater. Sci. 41, 5099 (2006).CrossRefGoogle Scholar
Toimil Molares, M.E., et al. ., Adv. Mater. 13, 62 (2001).3.0.CO;2-7>CrossRefGoogle Scholar
Akiyama, T., Staufer, U., de Rooij, N.F., Frederix, P., Engel, A., Rev. Sci. Instr. 74, 112 (2003).CrossRefGoogle Scholar
Ren, Z. et al. ., submitted to J. Synchrotron Radiat. (under review).Google Scholar
Mastropietro, F. et al. ., Optics Express 19, 19223 (2011).CrossRefGoogle Scholar
Eshelby, J.D., J. Appl. Phys. 24, 176 (1953).CrossRefGoogle Scholar
Mordehai, D., Kazakevich, M., Srolovitz, D.J., Rabkin, E., Acta Materialia 59, 2309 (2011).CrossRefGoogle Scholar