Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-25T18:40:25.970Z Has data issue: false hasContentIssue false

Improved Properties of a-SiC:H Alloys with Reduced Density of CH3 Radicals

Published online by Cambridge University Press:  21 February 2011

S. S. Camargo Jr
Affiliation:
Progama de Engenharia Metalurgica e de Materials - COPPE Universidade Federai do Rio de Janeiro, Caixa Postai 68505, Rio de Janeiro, RJ, CEP 21945, Brazil.
M. L. de Oliveira
Affiliation:
Progama de Engenharia Metalurgica e de Materials - COPPE Universidade Federai do Rio de Janeiro, Caixa Postai 68505, Rio de Janeiro, RJ, CEP 21945, Brazil.
A. A. Pasa
Affiliation:
Progama de Engenharia Metalurgica e de Materials - COPPE Universidade Federai do Rio de Janeiro, Caixa Postai 68505, Rio de Janeiro, RJ, CEP 21945, Brazil.
C. Gatts
Affiliation:
Progama de Engenharia Metalurgica e de Materials - COPPE Universidade Federai do Rio de Janeiro, Caixa Postai 68505, Rio de Janeiro, RJ, CEP 21945, Brazil.
Get access

Abstract

In this paper we report on the properties of a-SiC:H alloys with reduced density of CH3 radicals obtained by hydrogen dilution of gases. A reduced density of voids, hydrogen content and density of carbon bonded hydrogen atoms, were obtained; while carbon content and density of Si-H bonds are not affected much. A reduction of the optical gap and an increase of the refractive index were observed and related to the reduced densities of CH3 groups and voids. Dark- and photo- conductivity measurements showed that a performance comparable to the best undiluted films may be easily achieved, associated with a shift of the dark Fermi level towards the conduction band.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Matsuda, A. and Tanaka, K.; J. Non-Cryst. Sol. 97&98, 1367 (1987).Google Scholar
[2] Mohring, H. -D., Abel, C. -D., Bruggemann, R. and Bauer, G. H.; J. Non-Cryst. Sol. 137&138, 847 (1991).Google Scholar
[3] Alvarez, F., Sebastiani, M., Pozzilli, F., Fiorini, P. and Evangelisti, F.; J. Appl. Phys. 71, 267 (1992).CrossRefGoogle Scholar
[4] Camargo, S. S. Jr and Beyer, W.; J. Non-Cryst. Sol. 114, 807 (1989).Google Scholar
[5] de Oliveira, M. L., Camargo, S. S. Jr and Freire, F. L. Jr; J. Appl. Phys. 71, 1531 (1992).Google Scholar
[6] Camargo, S. S. Jr and de Oliveira, M. L.; J. Appl. Phys. (submitted).Google Scholar
[7] Dischler, B., Bubenzer, A. and Koidl, P.; Sol. St. Comm. 48, 105 (1983).Google Scholar
[8] Lin, W. -L., Tsai, H. -K., Lee, S. -C., Sah, W. -J. and Tzeng, W. -J.; Appl. Phys. Lett. 51, 2112 (1987).Google Scholar
[9] Bullot, J. and Schmidt, M. P.; Phys. Stat. Sol. (b) 143, 345 (1987).Google Scholar
[10] Sah, W. -J., Tsai, H. -K. and Lee, S. -C; Appl. Phys. Lett. 54, 617 (1989).Google Scholar