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The Importance of In Situ Monitors in the Preparation of Layered Oxide Heterostructures by Reactive MBE

Published online by Cambridge University Press:  10 February 2011

D.G. Schlom
Affiliation:
Department of Materials Science and Engineering, Penn State University, University Park, PA 16803-6602, [email protected]
J.H. Haenit
Affiliation:
Department of Materials Science and Engineering, Penn State University, University Park, PA 16803-6602
C.D. Theis
Affiliation:
Department of Materials Science and Engineering, Penn State University, University Park, PA 16803-6602
W. Tian
Affiliation:
Department of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI 48109-2136
X.Q. Pan
Affiliation:
Department of Materials Science and Engineering, The University of Michigan, Ann Arbor, MI 48109-2136
G.W. Brown
Affiliation:
Center for Materials Science, Los Alamos National Laboratory, Los Alamos, NM 87545
M.E. Hawley
Affiliation:
Center for Materials Science, Los Alamos National Laboratory, Los Alamos, NM 87545
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Abstract

Using a variety of in situ monitors and when possible adsorption-controlled growth conditions, layered oxide heterostructures including new compounds and metastable superlattices have been grown by reactive molecular beam epitaxy (MBE). The heteroepitaxial layers grown include Bi4Ti3 O12—SrTiO3 and Bi4Ti3O12—PbTiO3 Aurivillius phases, Srn+1TinO3n+1 Ruddlesden-Popper phases, and metastable PbTiO3 / SrTiO3 and BaTiO3 / SrTiO3 superlattices. Accurate composition control is key to the controlled growth of such structures, and to this end combinations of reflection high-energy electron diffraction (RHEED), atomic absorption spectroscopy (AA), a quartz crystal microbalance (QCM), and adsorption-controlled growth conditions were employed during growth. The structural perfection of the films has been investigated using in situ RHEED, four-circle x-ray diffraction, atomic force microscopy (AFM), and high-resolution transmission electron microscopy (TEM).

Type
Research Article
Copyright
Copyright © Materials Research Society 2000

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References

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