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Impedance Spectroscopy of Nanocrystalline Y-Stabilized Tetragonal Zirconia

Published online by Cambridge University Press:  10 February 2011

P. Mondal  and
H. Hahn
P. Mondal
Affiliation:
Department of Materials Science, Thin Film Division, Darmstadt University of Technology, Petersenstr. 23, D-64287 Darmstadt, Germany
H. Hahn
Affiliation:
Department of Materials Science, Thin Film Division, Darmstadt University of Technology, Petersenstr. 23, D-64287 Darmstadt, Germany
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Abstract

Impedance Spectroscopy, X-Ray Diffraction and High Resolution Scanning Electron Microscopy have been used to study the effect of extremely fine grain size on electrical properties such as dc-conductivity and activation energies in nanocrystalline Y-stabilized tetragonal zirconia. The samples were prepared from powders produced by the Inert Gas condensation method. X-Ray Diffraction was used to characterize phase and average grain size of the sample. In addition, grain size and microstructure of the sample was examined using High Resolution Scanning Electron Microscopy. With Impedance Spectroscopy relaxations of O−2-ions in the lattice and in the grain boundaries could be resolved. The dc-conductivities of the lattice and the grain boundaries were deduced from the data. The activation energies for ac- and dc-conductivity of the lattice and grain boundary relaxation are reported.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 500: Symposium EE – Electrically Based Microstructural Characterization II , 1997 , 273
Copyright
Copyright © Materials Research Society 1998

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References

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