Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-25T17:24:46.107Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging of Defects in Cadmium Telluride using High Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  15 February 2011

F. A. Ponce ,
T. Yamashita ,
R. H. Bube  and
R. Sinclair
F. A. Ponce
Affiliation:
Department of Materials Science and Engineering, Stanford UniversityStanford, CaliforniaUSA
T. Yamashita
Affiliation:
Department of Materials Science and Engineering, Stanford UniversityStanford, CaliforniaUSA
R. H. Bube
Affiliation:
Department of Materials Science and Engineering, Stanford UniversityStanford, CaliforniaUSA
R. Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford UniversityStanford, CaliforniaUSA
Get access

Abstract

The defect structure of cadmium telluride has been investigated using high resolution transmission electron microscopy. The variation of the TEM images with the defocus value is discussed, and defect symmetry considerations are used to correlate the image contrast characteristics with the lattice struc ture. Experimental micrographs of stacking faults and dislocations in the structure are analyzed.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 2: Symposium – Defects in Semiconductors I , 1980 , 503
Copyright
Copyright © Materials Research Society 1981

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Petrenko, V. F., Whitworth, R. W., Phil. Mag. A 41, 681 (1980).Google Scholar
2. Spence, J. C. H., Kolar, H., Phil. Mag. A 39, 59 (1980).Google Scholar
3. Sato, M., Hiraga, K. and Sumino, K., Japan. J. Appl. Phys. 19, L155 (1980).Google Scholar
4. Olsen, A. and Spence, J. C. H., Phil. Mag. (1980) in press.Google Scholar
5. Spence, J. C. H., Proc. 38th Annual Meeting EMSA (San Francisco, 1980), 282.Google Scholar
6. Chiang, S. W., Carter, C. B. and Kohlstedt, D. L., Phil. Mag. A 42, 103 (1980).Google Scholar
7. Bourret, A. and Desseaux, J., J. de Phys. C6, 7 (1979).Google Scholar
8. Pirouz, P., Phil. Mag. A 41, 33 (1980).CrossRefGoogle Scholar
9. Yamashita, T., Ponce, F. A., Pirouz, P. and Sinclair, R. (to be published).Google Scholar