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Imaging of Defects in Cadmium Telluride using High Resolution Transmission Electron Microscopy
Published online by Cambridge University Press: 15 February 2011
Abstract
The defect structure of cadmium telluride has been investigated using high resolution transmission electron microscopy. The variation of the TEM images with the defocus value is discussed, and defect symmetry considerations are used to correlate the image contrast characteristics with the lattice struc ture. Experimental micrographs of stacking faults and dislocations in the structure are analyzed.
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- Copyright © Materials Research Society 1981
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