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Hydrogenation of B and P Implanted LPCVD Amorphous Silicon
Published online by Cambridge University Press: 21 February 2011
Abstract
The results of the investigation of doping by B and P ion implantation into LPCVD amorphous silicon films in the range from 2*1015 to 2*1021 atoms/cm3 are presented. The room temperature conductivity increases to 10-2 Ω-1 cm-1 and to 10-2 Ω-1 cm-1 for the highest B and P doping, respectively. The subsequent hydrogenation (2.5 and 5 at%) by ion implantation increases the doping efficiency for P doping. For B doping efficiency increases at the low and decreases for the high doping range. The results of conductivity measurements vs temperature of doped and hydrogenated films are presented.
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- Copyright © Materials Research Society 1992
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