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Hot Embossing of Electron Beam Generated Structures in Polypropylene

Published online by Cambridge University Press:  17 March 2011

Patrick W. Leech*
Affiliation:
CSIRO, CMMT, Gate 5, Normanby Road, Clayton, Victoria, 3169, Australia
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Abstract

The hot embossing of electron beam generated structures with linewidths 0.35-3.25 μm has been examined in biaxially-oriented polypropylene (BOPP). The individual test elements consisted of pixels of 30 x 30 μm with a specific configuration of symbols and lettering. The embossing of these features has been performed as a function of temperature (80-140 °C) and applied pressure (2-20 kPa). Significant increases in both embossed depth and sidewall angle was evident over the temperature range 100 to 130 °C with a leveling off at higher temperatures attributed to the onset of a regime of viscous liquid flow. At temperatures within this regime, a critical level of pressure was required to fill the mold features. Accurate embossing of medium and coarse lettering (0.50-0.65 μm linewidth) and geometric symbols (1.25-3.25 μm linewidth) has been demonstrated at a temperature of 130 °C and an applied pressure of 13 kPa. The finest lettering (0.35 μm linewidth) was incompletely embossed under these conditions.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

REFERENCES

1. Guo, L.J., J. Phys.D:Appl.Phys., 37 R123 (2004).Google Scholar
2. Studer, V., Pepin, A. and Chen, Y., Appl.Phys.Lett., 80(19) 3614 (2002).Google Scholar
3. Schift, H., David, C., Gabriel, M., Gobrecht, J., Heyderman, L.J., Kaiser, W., Koppel, S. and Scandella, L., Microelectron. Eng., 53171 (2000).Google Scholar
4. Heyderman, L.J., Schift, H., David, C., Gobrecht, J. and Schweizer, T., Microelectron.Eng., 54 229 (2000).Google Scholar
5. Scheer, H.-C. and Schultz, H., Microelectron. Eng., 56 311 (2001).Google Scholar
6. Chen, J., Yin, L., Yang, X. and Zhou, E., Polymer Eng. and Sci., 44(9) 1749 (2004).Google Scholar
7. Androsch, R. and Wunderlich, B., Macromolecules, 34 5950 (2001).Google Scholar
8. Leech, P.W. and Lee, R.A., Microelectron. Eng., 84(1) 25 (2007).Google Scholar