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High-Resolution Electron Microscopy Studies of Co/Cr Multilayers
Published online by Cambridge University Press: 21 February 2011
Abstract
The growth characteristics of Co/Cr multilayers have been studied in cross-section with a 400kV high-resolution electron microscope. The growth directions for bcc Cr were predominantly <110> while the axes of the observed crystallite fringes were mainly <100> and <111>. The hcp Co crystallites grew predominantly in the <10.1> direction while the areas with strong fringes were along a <10.0> projection. This observed structure was in agreement with that obtained from analysis of large angle X-ray scattering spectra. The columnar structure was found to be present with the layers growing right through the columns.
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- Copyright © Materials Research Society 1989
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