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High-Resolution Electron Microscopy of Quasicrystals

Published online by Cambridge University Press:  21 February 2011

K. Hiraga*
Affiliation:
Institute for Materials Research, Tohoku University, Katahira, Sendai 980, Japan
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Abstract

I review the current results of our group about high-resolution electron microscopy of the icosahedral quasicrystals, in particular, in rapidly solidified Al-Mn-Si and conventionally solidified Al-Fe-Cu alloys, by using 200 kV and 1 MV microscopes which have resolutions of .23 and .16 nm, respectively. High-resolution lattice images of Al-Mn-Si taken with the 200 kV microscope show characteristic features of a model of the three-dimensional Penrose tiling, and also show the existence of quenched phason strains and edge-type dislocations in the Al-Mn-Si and as-casted Al-Fe-Cu alloys. After annealing the stable Al-Fe-Cu icosahedral phase at 1118 K for 48 hr, quenched phason strains are almost relaxed and nearly perfect icosahedral symmetry is formed. A high-resolution structure image of Al-Mn-Si taken with the 1 MV microscope clearly shows an arrangement of the Mackay icosahedral atomic clusters.

Type
Research Article
Copyright
Copyright © Materials Research Society 1989

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References

REFERENCES

1. Schechtman, D., Blech, I. A., Gratias, D. and Cahn, J. W., Phys. Rev. Lett. 53, 1951 (1988).CrossRefGoogle Scholar
2. Hiraga, K., Hirabayashi, M., Inoue, A. and Masumoto, T., Sci. Rep. Res. Ins. Tohoku Univ. A 32, 32 (1985).Google Scholar
3. Hiraga, K., Hirabayashi, M., Inoue, A. and Masumoto, T., J. Phys. Soc. Jpn. 54, 4077 (1985).CrossRefGoogle Scholar
4. Hiraga, K., Hirabayashi, M., Inoue, A. and Masumoto, T., J. Microscopy 146, 245 (1987).Google Scholar
5. Hiraga, K. and Hirabayashi, M., Jpn. J. Appl. Phys. 26, L155 (1987).Google Scholar
6. Tanaka, M., Terauchi, M., Hiraga, K. and Hirabayashi, M., Ultramicroscopy 17, 279 (1985).CrossRefGoogle Scholar
7. Hiraga, K. and Hirabayashi, M., J. Electron Microsc. 36, 353 (1987).Google Scholar
8. Elser, V. and Henley, C. L., Phys. Rev. Lett. 55, 2883 (1985).Google Scholar
9. Guyot, P. and Audier, M., Phil. Mag. B 53, L43 (1986).Google Scholar
10. Yamamoto, A. and Hiraga, K., Phys. Rev. B37, 6207 (1988).Google Scholar
11. Hiraga, K., Zhang, Bo-Ping, Hirabayashi, M., Inoue, A. and Masumoto, T., Jpn. J. Appl. Phys. 27, L951 (1988).Google Scholar
12. Socolar, J. E. S., Lubensky, T. C. and Steinhardt, P. J., Phys. Rev. 34, 334 (1986).Google Scholar
13. Tsai, An-Ping, Inoue, A. and Masumoto, T., Jpn. J. Appl. Phys. 26, L1505 (1987); 27, L1587 (1988).Google Scholar