Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-19T03:19:37.412Z Has data issue: false hasContentIssue false
  • English
  • Français

A High-Resolution Angle-Resolved Photoemission Study of the Temperature Dependent Electronic Structure of the Pentatelluride ZrTe5

Published online by Cambridge University Press:  10 February 2011

D. N. McIlroy ,
Daqing Zhang ,
Bradley Kempton ,
J. Wharton ,
R. T. Littleton ,
T. M. Tritt  and
C. G. Olson
D. N. McIlroy
Affiliation:
Department of Physics, University of Idaho, Moscow, ID 83844-0903
Daqing Zhang
Affiliation:
Department of Physics, University of Idaho, Moscow, ID 83844-0903
Bradley Kempton
Affiliation:
Department of Physics, University of Idaho, Moscow, ID 83844-0903
J. Wharton
Affiliation:
Department of Physics, University of Idaho, Moscow, ID 83844-0903
R. T. Littleton
Affiliation:
Department of Physics, Clemson University, Clemson, SC 29634-1911
T. M. Tritt
Affiliation:
Department of Physics, Clemson University, Clemson, SC 29634-1911
C. G. Olson
Affiliation:
Ames Laboratory, Iowa State University, Ames, IA 50011
Get access

Abstract

The temperature dependent band structure of the pentatelluride ZrTe5 has been examined using the technique of high-resolution angle-resolved photoemission in conjunction with synchrotron radiation. Specifically, the band dispersion along the X-Γ-X high symmetry axis was mapped at 20K (T<Tc) and 170K (T>Tc), where Tc≃160K. One electron band and two hole bands within 0.5eV of the Fermi level have been identified. The dispersion of the bands indicates that they have extremely small electron and hole effective masses. The hole bands were observed to distort and shift in energy upon raising the sample temperature above Tc, indicative of a surface distortion.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 590: Symposium R – Applications of Synchrotron Radiation Techniques…V , 1999 , 57
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

[1] Demuth, J. E., Persson, B. N. J., Holtzberg, F., and Chandrasekhar, C. V., Phys. Rev. Lett. 64, 603 (1990).10.1103/PhysRevLett.64.603Google Scholar
[2] Norman, M. R., Ding, H., Randeria, M., Campuzano, J. C., Yokoya, T., Takeuchi, T., Mochiku, T., Kadowaki, K., Guptasarma, P., and Hinks, D. G., Nature 392, 157 (1998).10.1038/32366Google Scholar
[3] Li, Yonghong, Huang, Jin Lin, and Lieber, Charles M., Phys. Rev. Lett. 68, 3240 (1992).10.1103/PhysRevLett.68.3240Google Scholar
[4] Mills, D. L., Phelps, R. B., and Kesmodel, L. L., Phys. Rev. B 50, 6394 (1994).10.1103/PhysRevB.50.6394Google Scholar
[5] Romberg, H., Alexander, M., Nücker, N., Adelmann, P., and Fink, J., Phys. Rev. B 42, 8768 (1990).10.1103/PhysRevB.42.8768Google Scholar
[6] Allen, J. W., Olson, C. G., Maple, M. B., Kang, J.-S., Liu, L. Z., Park, J.-H., Anderson, R. O., Ellis, W. P., Markert, J. T., Dalichaouch, Y., Liu, R., Phys. Rev. Lett. 64, 595 (1990).10.1103/PhysRevLett.64.595Google Scholar
[7] Shen, Z. X., Dessau, D. S., Wells, B. O., King, D. M., Spicer, W. E., Arko, A. J., Marshall, D., Lombardo, L. W., Kapitulnik, A., Dickinson, P., Doniach, S., DiCarlo, J., Loeser, A. G., Park, C. H., Phys. Rev. Lett. 70, 1553 (1993).10.1103/PhysRevLett.70.1553Google Scholar
[8] McIlroy, D. N., Zhang, J., Liou, S.-H., and Dowben, P. A., Phys. Lett. A 207, 367 (1995).10.1016/0375-9601(95)00672-PGoogle Scholar
[9] McIlroy, D. N., Waldfried, C., Zhang, Jiandi, Choi, J.-W., Foong, F., Liou, S.-H., and Dowben, P. A., Phys. Rev. B 54, 17438 (1996).10.1103/PhysRevB.54.17438Google Scholar
[10] Park, J.-H., Chen, C. T., Cheong, S.-W., Bao, W., Meigs, G., Chakarian, V., and Idzerda, Y. U., J. Appl. Phys. 79, 4558 (1996).10.1063/1.361724Google Scholar
[11] Park, J.-H., Chen, C. T., Cheong, S.-W., Bao, W., Meigs, G., Chakarian, V., and Idzerda, Y. U., Phys. Rev. Lett. 76, 4215 (1996).10.1103/PhysRevLett.76.4215Google Scholar
[12] Dessau, D. S., Saitoh, T., Park, C.-H., Shen, Z.-X., Villella, P., Hamada, N., Moritomo, Y., and Tokura, Y., Phys. Rev. Lett. 81, 192 (1998).10.1103/PhysRevLett.81.192Google Scholar
[13] Smith, K. E., Annual Reports C, 115 (1993).10.1039/pc9939000115Google Scholar
[14] Breuer, Klaus, Stagerescu, Cristian, Smith, Kevin E., Greenblatt, Martha, and Ramanujachary, Kandalam, Phys. Rev. Lett. 76, 3172 (1996).10.1103/PhysRevLett.76.3172Google Scholar
[15] Gweon, G.-H., Denlinger, J. D., Clack, J. A., Allen, J. W., Olson, C. G., DiMasi, E., Aronson, M. C., Foran, B., and Lee, S., Phys. Rev. Lett. 81, 886 (1998).10.1103/PhysRevLett.81.886Google Scholar
[16] Nakamuru, M., Sekiyama, A., Namatame, H., Fujimori, A., Yoshihara, H., Ohtani, T., Misu, A., and Takano, M., Phys. Rev. B 49, 16191 (1994).10.1103/PhysRevB.49.16191Google Scholar
[17] Haruyama, Y., Kodaira, S., Aiura, Y., Bando, H., Nishihara, Y., Maruyama, T., Sakisaka, Y., and Kato, H., Phys. Rev. B 53, 8032 (1996).10.1103/PhysRevB.53.8032Google Scholar
[18] Zhang, Zhaoming, Jeng, Shin-Puu, and Henrich, Victor E., Phys. Rev. B 43, 12004 (1991).10.1103/PhysRevB.43.12004Google Scholar
[19] Nerlov, Jesper, Ge, Qingfeng, and Moller, Preben J., Surf. Sci. 348, 28 (1996).10.1016/0039-6028(95)00990-6Google Scholar
[20] Lad, Robert. J. and Henrich, Victor E., Phys. Rev. B 38, 10860 (1988).10.1103/PhysRevB.38.10860Google Scholar
[21] Smith, Kevin E. and Henrich, Victor E., Phys. Rev. B 38, 5965 (1988).10.1103/PhysRevB.38.5965Google Scholar
[22] ellis, W. P., Boring, A. M., Allen, J. W., Cox, L. E., Cowan, R. D., Pate, B. B., Arko, A. J., and Lindau, I., Sol. Stat. Commun. 72, 725 (1989).10.1016/0038-1098(89)90682-0Google Scholar
[23] Breuer, Klaus, Goldberg, David M., Smith, Kevin E., Greenblatt, Martha, and McCarroll, William, Sol. Stat. Commun. 94, 601 (1995).10.1016/0038-1098(95)00143-3Google Scholar
[24] Inoue, I. H., Hase, I., Aiura, Y., Fujimori, A., Morikawa, K., Mizokawa, T., Haruyama, Y., Maruyama, T., and Nishihara, Y., Physica C 235–240, 1007 (1994).10.1016/0921-4534(94)91728-0Google Scholar
[25] Kamm, G. N., Gillespie, D. J., Ehrlich, A.C., Wieting, T. J., and Levy, F., Phys. Rev. B 31, 7617 (1985).10.1103/PhysRevB.31.7617Google Scholar
[26] Kamm, G. N., Gillespie, D. J., Ehrlich, A.C., Peebles, D. L., and Levy, F., Phys. Rev. B 35, 1223 (1987).10.1103/PhysRevB.35.1223Google Scholar
[27] Littleton, R. T. IV, Tritt, T. M., Feger, C. R., Kolis, J., Wilson, M. L., Marone, M., Payne, J., Verebeli, D., and Levy, F., Appl. Phys. Lett. 72, 2056 (1998).10.1063/1.121406Google Scholar
[28] For a review see for example, Eastman, D. E. and Himpsel, F. J.. “Photoelectron Spectroscopy,” Encyclopedia of Physics, Second Ed., 908-912, New York, VCH Publishers, 1991.Google Scholar