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Highly Sensitive Absorption Measurements in Organic Thin Films: Charge Transfer Complexes and Light-Induced Changes

Published online by Cambridge University Press:  21 February 2011

Andrew Skumanich
Andrew Skumanich*
Affiliation:
IBM Almaden Research Center, K67/802, 650 Harry Rd. San Jose, CA 95120.
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Abstract

Using the sensitive absorption technique of Photothermal Deflection Spectroscopy (PI1S) it is possible to detect subtle spectral features in the absorption spectra of polymeric thin films that cannot be detected by other means. This paper describes observations of weak charge-transfer complex (CIC) formation and also light-induced changes in various organic films. The filns studied were those commonly used as charge transport materials in organic photoconductors, comprised of a small transport molecule and a polymer binder. The optically measured CTC bands can be used to establish single electron energy levels of the constituents. Reproducible photo-induced changes are manifest both in the strong UV transitions as well as in the “sub-gap” absorption and appear to be correlated with the photo-chemical stability of the constituents. The light-fatigue has both a reversible as well as irreversible component.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 228: Symposium N – Materials for Optical Information Processing , 1991 , 85
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1 Jackson, W.B., Asner, N.M., et. al., Applied Optics, 20 p1333 (1981); N.M. Amer in Semiconductors and Semimetals Vol.21, Part B, p83 (Academic Press NY 1984) Willardson and Beer editors.Google Scholar
2 Skumanich, Andrew and Scott, J. C., Mo. Cryst. Liq. Cryst., 183 p365 (1990).Google Scholar
3 Skumanich, A., et. al. Phys. Rev. B, 31 p2263 (1985);Physica 117B p897 (1983).Google Scholar
4 Staebler, D. and Wronski, E., Appl. Phys. Lett., 31 p292 (1977).Google Scholar
5 Kanemnitsu, Y. and Imamura, S., Solid State Comm., 68 p701 (1988); and A. Skumanich, et. al. IBM Internal report.Google Scholar