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High Strength Nanoscale Al/Al3Sc Multilayers formed by Interface Reaction

Published online by Cambridge University Press:  01 February 2011

M.A. Phillips ,
B.M. Clemens  and
W.D. Nix
M.A. Phillips
Affiliation:
Department of Materials Science & Engineering, Stanford University, Stanford, CA 94305
B.M. Clemens
Affiliation:
Department of Materials Science & Engineering, Stanford University, Stanford, CA 94305
W.D. Nix
Affiliation:
Department of Materials Science & Engineering, Stanford University, Stanford, CA 94305
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Abstract

Polycrystalline Al/Sc multilayer samples are grown via magnetron sputtering. The deposition of Sc onto Al results in significant intermixing between the two components. Substrate curvature, measured in-situ during deposition, reveals behavior similar to that seen in other systems where a slow diffuser is deposited onto a fast diffuser. The multilayer films are further characterized via transmission electron microscopy (TEM), analytical electron microscopy, and X-ray diffraction (XRD), confirming the intermixing and formation of a coherent crystalline phase, likely to be Al3Sc, in the interfacial regions. Nanoindentation hardness tests show that by adding a few percent of Sc to Al films and carefully controlling the location of the Sc, increases in hardness up to 6 times that of a pure Al film can be obtained.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 727: Symposium R – Nanostructured Interfaces , 2002 , R5.10
Copyright
Copyright © Materials Research Society 2002

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