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High Resolution Synchrotron X-Ray Diffraction Tomography Of Large-Grained Samples

Published online by Cambridge University Press:  15 February 2011

D.P. Piotrowski ,
S.R. Stock ,
A. Guvenilir ,
J.D. Haase  and
Z.U. Rek
D.P. Piotrowski
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
S.R. Stock
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
A. Guvenilir
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
J.D. Haase
Affiliation:
School of Materials Sci. and Eng., Georgia Inst. of Technology, Atlanta, GA
Z.U. Rek
Affiliation:
Stanford Synchrotron Radiation Laboratory, SLAC, Stanford Univ., Stanford, CA
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Abstract

In order to understand the macroscopic response of polycrystalline structural materials to loading, it is frequently essential to know the spatial distribution of strain as well as the variation of micro-texture on the scale of 100 μm. The methods must be nondestructive, however, if the three-dimensional evolution of strain is to be studied. This paper describes an approach to high resolution synchrotron x-ray diffraction tomography of polycrystalline materials. Results from model samples of randomly-packed, millimeter-sized pieces of Si wafers and of similarly sized single-crystal Al blocks have been obtained which indicate that polychromatic beams collimated to 30 μm diameter can be used to determine the depth of diffracting volume elements within ± 70 μm. The variation in the two-dimensional distribution of diffracted intensity with changing sample to detector separation is recorded on image storage plates and used to infer the depth of diffracting volume elements.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 437: Symposium DD – Applications of Synchrotron Radiation to III , 1996 , 125
Copyright
Copyright © Materials Research Society 1996

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References

1. Stock, S.R., Guvenilir, A., Piotrowski, D.P. and Rek, Z.U., MRS Symp Proc 375, 275 (1995).Google Scholar
2. Piotrowksi, D.P., “Synchrotron Polychromatic X-ray Diffraction Tomography of Largegrained Polycrystalline Materials,” MS Thesis, Georgia Inst. of Technology, March 1996.Google Scholar
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