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High Resolution Microanalysis of Interfaces

Published online by Cambridge University Press:  25 February 2011

Anthony J. Garratt-Reed
Anthony J. Garratt-Reed*
Affiliation:
Center for Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
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Extract

Of great importance in many fields of endeavor is the analysis of solutes segreoated to grain boundaries in solids. Such segregation is usually (but not always) limited to the boundary plane, and can, therefore, be thought of as being “two-dimensional”.

Type
Articles
Information
MRS Online Proceedings Library (OPL) , Volume 62: Symposium Q – Materials Problem Solving with the Transmission Electron Microscope , 1985 , 115
Copyright
Copyright © Materials Research Society 1986

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References

1. Garratt-Reed, A. J., Scanning Electron Microsc. 1985:I, 21, (1985).Google Scholar
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3. Reed, S. J. B., Ultramicroscopy 7, 405, (1982).Google Scholar
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5. Marks, L. D. (Private communication).Google Scholar
6. Hall, E. L., Imeson, D. and Sande, J. B. Vander, Phil. Mag. A43, 1569, (1981).Google Scholar
7. Cai, X-L, Garratt-Reed, A. J. and Owen, W. S., Metall. Trans. A., 16A, 543 (1985).CrossRefGoogle Scholar
8. Przbylski, K., Garratt-Reed, A. J. and Yurek, G. J., submitted to J. Electrochem. Soc., (1986).Google Scholar
9. Sande, J. B. Vander, Garratt-Reed, A. J., Chiang, Y-M and Thorvaldsson, T., Ultramicroscopy 14, 65 (1984).Google Scholar