Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-27T02:35:30.031Z Has data issue: false hasContentIssue false
  • English
  • Français

High Resolution Electron Microscopy of Grain Boundaries in Nanophase Palladium*

Published online by Cambridge University Press:  22 February 2011

G. J. Thomas ,
R. W. Siegel  and
J. A. Eastman
G. J. Thomas
Affiliation:
Division 8341, Sandia National Laboratories, Livermore, CA. 94551-0969
R. W. Siegel
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL. 60439-4838
J. A. Eastman
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL. 60439-4838
Get access

Abstract

Using high resolution electron microscopy, consolidated nanophase palladium samples were examined following electrolytic thinning after a hydriding - dehydriding cycle at 310 K. Due to the small size and random orientations of the individual grains, a large number of grain boundaries were available for examination. Some of these yielded adequate imaging conditions to allow observation of the lattice structure in the grain boundary regions. Image simulations were performed to determine the sensitivity of the technique to lattice disorder. The results of these studies suggest that grain boundary structures in nanophase palladium are similar to those in conventional coarse-grained polycrystals.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 153: Symposium J – Interfaces Between Polymers, Metals, and Ceramics , 1989 , 13
Copyright
Copyright © Materials Research Society 1989

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Footnotes

*

This work was supported by the U. S. Department of Energy, BES-Materials Sciences, under Contracts DE-AC04-76DP00789 at Sandia National Laboratories and W-31-109-Eng-38 at Argonne National Laboratory.

References

1. Mtitschele, T. and Kirchheim, R., Scripta Metall. 21, 315, 1101 (1987).Google Scholar
2. Wallner, G., Jorra, E., Franz, H., Peisl, J., Birringer, R., Gleiter, H., Haubold, T. and Petry, W., Mater. Res. Soc. Symp. Proc. 132, 149 (1989).Google Scholar
3. Birringer, R., Gleiter, H., Klein, H. P. and Marquardt, P., Phys. Lett., 102A, 365 (1984).Google Scholar
4. Zhu, X., Birringer, R., Herr, U. and Gleiter, H., Phys. Rev. B 35, 9085 (1987).Google Scholar
5. Birringer, R., Mater. Sci. and Engineering A, in press (1989).Google Scholar
6. Melendres, C. A., Narayanasamy, A., Maroni, V. A. and Siegel, R. W., these Proceedings.Google Scholar
7. Epperson, J. E., Siegel, R. W., White, J. W., Klippert, T. E., Narayanasamy, A., Eastman, J. A. and Trouw, F., Mater. Res. Soc. Symp. Proc. 132, 15 (1989).Google Scholar
8. Eastman, J. A. and Thompson, L. J., these Proceedings.Google Scholar
9. Stadelmann, P., Ultramicroscopy 21, 131 (1987).Google Scholar
10. Siegel, R. W. and Hahn, H., in Current Trends in the Physics of Materials, Yussouff, M., ed. (World Scientific Publ., Singapore, 1987) p. 403; R. W. Siegel and J. A. Eastman, Mater. Res. Soc. Symp. Proc. 132, 3 (1989).Google Scholar
11. Raj, R. and Sass, S. L., eds., Interface Science and Engineering 1987, J. de Physique 49, Colloque C5 (1988).Google Scholar
12. Birringer, R., Hahn, H., Höfler, H., Karch, J. and Gleiter, H., Defect and Diffusion Forum 59, 17 (1988).Google Scholar