Hostname: page-component-78c5997874-m6dg7 Total loading time: 0 Render date: 2024-11-17T19:15:32.252Z Has data issue: false hasContentIssue false

High Conductive a-Si:H/a-SiC:H:F Super Lattice Prepared by a Chemically Controlled Method

Published online by Cambridge University Press:  26 February 2011

H. Koinuma
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, Japan 113
M. Kawasaki
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, Japan 113
K. Fueki
Affiliation:
Department of Industrial Chemistry, Faculty of Engineering, University of Tokyo, 7-3-1 Hongo, Bunkyo-ku, Tokyo, Japan 113
Get access

Abstract

Amorphous super lattices composed of a-Si:H and a-SiC:H:F layers were continuously prepared from a gas miture of CF4 and either SiH4 or Si2 H6 by the pulsed plasma and photo (PP&P) CVD method. The method utilizes the difference in photochemical reactivity of the source gases for the formation of layered structure. The layered films prepared by using Si2H6 as silicon source under the condition that they had optical gaps up to 2.0 eV were found to show photoconductivities higher not only than those of a-SiC:H:F films prepared from the same gas mixture by the continuous plasma and photo hybrid CVD but also than those of a-Si:H films by the photo CVD. From the comparison of optical and electrical properties of super lattices prepared, the photoconductivity of the films is suggested to be primarily dependent on the quality of barrier layer rather than on the quality of well layer.

Type
Research Article
Copyright
Copyright © Materials Research Society 1987

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

[1] Tiedje, T., Abeles, B., Persans, P. D., Cody, B. G.; J. Non-Cryst. Solids, 66, 345(1984)Google Scholar
[2] Tsuda, S., Takahama, T., Tarui, H., Watanabe, K., Nakamura, N., Shibuya, H., Nakano, S., Ohnishi, M., Kishi, Y., and Kuwano, Y.; 18th IEEE Photvol. Specialists Conf. (Las Vegas, 1985) 11–A–7Google Scholar
[3] Kruangam, D., Deguchi, M., Endo, T., Guang-Pu, W., Okamoto, H., and Hamakawa, Y.; Ext. Abst. of 18th Int. Conf. on Solid State Devices and Materials (Tokyo, 1986) 683 Google Scholar
[4] Kawasaki, M., Matsuzaki, Y., Fueki, K., Koinuma, H., Nakajima, K., and Yoshida, Y.; to be published in Phys. Rev. Lett.Google Scholar
[5] Hundhausen, M., Ley, L., and Carius, R.; Phys. Rev. Lett., 53, 1598(1984)Google Scholar
[6] Kakalios, J. and Fritzsche, H.; Proc. 17th Int. Conf. Physics of Semiconductors, Springer-Verlag New York p 503Google Scholar
[7] Wronski, C. R., Tiedje, T., Abeles, B.; Proc. Mater. Res. Soc. Fall Meeting 1986, D9.10Google Scholar