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Heterostructures with Strained InGaAs Quantum Wells for RCE Photodiode Applications in the 1.8–2 μm Spectral Range

Published online by Cambridge University Press:  26 February 2011

Jadwiga Zynek
Affiliation:
Institute of Electronic Materials Technology, 133 Wolczynska str., 01–919 Warsaw, Poland
Agata Jasik
Affiliation:
Institute of Electronic Materials Technology, 133 Wolczynska str., 01–919 Warsaw, Poland
Jaroslaw Gaca
Affiliation:
Institute of Electronic Materials Technology, 133 Wolczynska str., 01–919 Warsaw, Poland
Marek Wojcik
Affiliation:
Institute of Electronic Materials Technology, 133 Wolczynska str., 01–919 Warsaw, Poland
Wlodzimierz Strupinski
Affiliation:
Institute of Electronic Materials Technology, 133 Wolczynska str., 01–919 Warsaw, Poland
Jaroslaw Rutkowski
Affiliation:
Institute of Applied Physics, Military University of Technology, 2 Kaliskiego Str., 00–908 Warsaw, Poland
Artur Wnuk
Affiliation:
Institute of Electronic Materials Technology, 133 Wolczynska str., 01–919 Warsaw, Poland
Krzysztof Klima
Affiliation:
Institute of Electronic Materials Technology, 133 Wolczynska str., 01–919 Warsaw, Poland
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Abstract

The results of the work on the technology and characterization methods of resonant cavity enhanced (RCE) photodiode heterostructures with strained InxGa1–xAs quantum wells (0.65≤x≤0.82), designed for the 1.8 - 2 μm spectral range, are presented. The heterostructures grown on InP by metalorganic chemical vapor deposition have been investigated by high-resolution X-ray diffraction with synchrotron source, transmission electron microscopy, photoluminescence and reflectivity spectra measurements. Non-resonant photodiodes fabricated from these epitaxial structures exhibit dark current densities below 10-6 A/cm2 and quantum efficiencies above 1 % (even without bias). These quantum efficiency values are a good basis for the resonant cavity enhancement. The optical field enhancement at quantum wells has been examined in resonant heterostructures before processing.

Type
Research Article
Copyright
Copyright © Materials Research Society 2005

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References

REFERENCES

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