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Heteroepitaxial growth of C60 on tetracene single crystal

Published online by Cambridge University Press:  12 February 2013

Tetsuhiko Miyadera*
Affiliation:
Japan Science and Technology Agency, PRESTO, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Hiroki Mitsuta
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan Graduate School of Science and Technology, Tokyo University of Science, 2641 Yamazaki, Noda, Chiba 278-8510, Japan
Noboru Ohashi
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Tetsuya Taima
Affiliation:
Japan Science and Technology Agency, PRESTO, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan Research Center of Sustainable Energy and Technology, Kanazawa University, Kakuma, Kanazawa, Japan
Ying Zhou
Affiliation:
Research Center of Sustainable Energy and Technology, Kanazawa University, Kakuma, Kanazawa, Japan
Toshihiro Yamanari
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
Yuji Yoshida
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), 1-1-1, Higashi, Tsukuba, Ibaraki 305-8565, Japan
*
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Abstract

We have developed a method for epitaxial growth of C60 thin films on tetracene single crystals. The crystal orientation of the C60 film was examined by reflection high energy electron diffraction (RHEED) and X-ray diffraction (XRD). In-situ observation by RHEED revealed that the C60 crystallizes from the very initial stage of the deposition (0.1 nm). A 6-fold symmetric pattern, which was observed in a XRD polar scan, can be taken as direct evidence for the epitaxial growth of C60 commensurate with the tetracene (001) surface lattice.

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Articles
Copyright
Copyright © Materials Research Society 2013

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References

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