Hostname: page-component-78c5997874-4rdpn Total loading time: 0 Render date: 2024-11-20T00:48:43.775Z Has data issue: false hasContentIssue false

Growth of SrS Thin Films by Atomic Layer Epitaxy

Published online by Cambridge University Press:  16 February 2011

M. Leskela
Affiliation:
Department of Chemistry, University of Helsinki, SF-00100 Helsinki, Finland
L. Niinistö
Affiliation:
Laboratory of Inorganic and Analytical Chemistry, Helsinki University of Technology, SF-02150 Espoo, Finland
E. Nykänen
Affiliation:
Department of Chemistry, University of Helsinki, SF-00100 Helsinki, Finland
P. Soininen
Affiliation:
Laboratory of Inorganic and Analytical Chemistry, Helsinki University of Technology, SF-02150 Espoo, Finland
M. Tiitta
Affiliation:
Laboratory of Inorganic and Analytical Chemistry, Helsinki University of Technology, SF-02150 Espoo, Finland
Get access

Abstract

The growth of strontium sulfide thin films in a flow-type Atomic Layer Epitaxy reactor from Sr(thd)2 (thd = 2,2,6,6-tetramethyl-3,5-heptanedione) and H2S has been studied. The growth is independent on flow rate and duration of the purge gas (N2) pulse and it does not depend on the Sr(thd)2 and H2S pulses either provided their amounts are sufficient to saturate the surface. The variables significantly affecting the growth rate are the substrate temperature and source temperature for Sr(thd)2. The observed lower than one monolayer growth rate is mainly due to the large size of the Sr(thd)2 molecule.

Type
Research Article
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Leskelä, M. and Tammenmaa, M., Mater. Chem. Phys. 16, 349 (1987).Google Scholar
2. Barrow, W.A., Coovert, R.E. and King, C.N., SID 84 Digest 1984, 249.Google Scholar
3. Tanaka, S., Shanker, V., Shiiki, M., Deguchi, H. and Kobayashi, H., SID 85 Digest 1985, 218.Google Scholar
4. Ogawa, M., Simouna, T., Nakada, S. and Yoshioka, T., Jpn. J. Appl. Phys. 24, 168 (1985).Google Scholar
5. Mach, R., Muller, G.O., Schneuerer, E., Selle, R. and Ohnishi, H., Acta Polytechn. Scand. Appl. Phys. Ser. Ph 170, 197 (1990).Google Scholar
6. Tanaka, S., Yoshiyama, H., Nishiura, J., Ohshio, S., Kawakami, H. and Kobayashi, H., SID 88 Digest 1988, 293.Google Scholar
7. Okamoto, S., Nakazawa, E. and Tsuchiya, Y., Jpn. J. Appl. Phys. 28, 406 (1989).Google Scholar
8. Tanaka, S., Yoshiyama, H., Nishiura, J., Ohshio, S., Kawakami, H. and Kobayashi, H., Proc. SID 29/4 1988, 305.Google Scholar
9. Abe, Y., Onisawa, K., Tamura, K., Nakayama, T., Hanazono, M. and Ono, Y.A., Jpn. J. Appl. P!hys. 28, 1373 (1989).CrossRefGoogle Scholar
10. Okamoto, S., Nakazawa, E. and Tsuchiya, Y., Jpn. J. Appl. Phys. 29, 1987 (1990).Google Scholar
11. Okamoto, S., Nakazawa, E., Kuki, T. and Tsuchiya, Y., Acta Polytechn. Scand. Appl. Phys. Ser. Ph 170, 203 (1990).Google Scholar
12. Gonzales, C., Conf. Record 1987 Inter. Display Res. Conf., 1987, 21.Google Scholar
13. Ohnishi, H. and Okuda, T., SID 89 Digest 1989, 317.Google Scholar
14. Shoki, T. and Yamaguchi, Y., Acta Polytechn. Scand. Appl. Phys. Ser. Ph 170, 207 (1990).Google Scholar
15. Tanada, S., Miyakoshi, A. and Nire, T., Springer Proceedings in Physics 38, 180 (1990).Google Scholar
16. Tanaka, S., Nakamura, K., Morita, H., Wada, S. and Kobayashi, H., Acta Polytechn. Scand. Appl. Phys. Ser. Ph 170, 211 (1990).Google Scholar
17. Tanaka, S., Deguchi, H., Mikami, Y., Shiiki, M. and Kobayashi, H., SID 86 Digest 1986, 29.Google Scholar
18. Okamoto, K. and Hanaoka, K., Jpn. J. Appl. Phys. 27, L1923 (1988).Google Scholar
19. Onisawa, K., Abe, Y., Tamura, K., Nakayama, T., Hanazono, M. and Ono, Y.A., J. Electrochem. Soc. 138, 599 (1991).CrossRefGoogle Scholar
20. Leppänen, M., Leskela, M., Niinistö, L., Nykanen, E., Soininen, P. and Tiitta, M., SID 91 Digest (1991), in press.Google Scholar
21. Tammenmaa, M., Antson, H., Asplund, M., Hiltunen, L., Leskela, M. and Niinistö, L., J. Cryst. Growth 84, 151 (1987).Google Scholar
22. Leskelä, M. and Niinistö, L., in Atomic Layer Epitaxy edited by Suntola, T. and Simpson, M. (Blackie & Sons, Glascow 1990) p. 1.Google Scholar
23. Leskela, M., Niinistö, L., Nykanen, E., Soininen, P. and Tiitta, M., Thermochim. Acta 175, 91 (1991).Google Scholar
24. Tammenmaa, M., Yliruokanen, I., Leskelä, M. and Niinistö, L., Anal. Chim. Acta 195, 351 (1987).CrossRefGoogle Scholar
25. Turnipseed, S.B., Barkley, R.M. and Sievers, R.W., Inorg. Chem. 30, 1164 (1991).Google Scholar