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Growth of c-GaN Films on the Nitridated β-Ga2O3 Substrates Using RF-MBE

Published online by Cambridge University Press:  01 February 2011

Tsutomu Araki
Affiliation:
[email protected], Ritsumeikan Univ., Dept. of Photonics, 1-1-1 Noji-higashi, Kusatsu, Shiga, 5258577, Japan, +81-77-561-5030, +81-77-561-3994
Chiharu Morioka
Affiliation:
[email protected], Ritsumeikan Univ., Dept. of Photonics, Japan
Junichi Wada
Affiliation:
[email protected], Ritsumeikan Univ., Dept. of Photonics, Japan
Keisuke Fujiwara
Affiliation:
[email protected], Ritsumeikan Univ., Dept. of Photonics, Japan
Hiroshi Minami
Affiliation:
[email protected], Ritsumeikan Univ., Dept. of Photonics, Japan
Yasushi Nanishi
Affiliation:
[email protected], Ritsumeikan Univ., Dept. of Photonics, Japan
Shigeo Ohira
Affiliation:
[email protected], Nippon Light Metal Co. Ltd., Japan
Norihito Suzuki
Affiliation:
[email protected], Nippon Light Metal Co. Ltd., Japan
Toetsu Shishido
Affiliation:
[email protected], Tohoku University, Institute for Materials Research, Japan
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Abstract

Cubic GaN is successfully grown on β-Ga2O3 by molecular beam epitaxy for the first time. Prior nitridation of the (100) β-Ga2O3 single-crystal substrate by exposure to electron cyclotron resonance nitrogen plasma causes the formation of a surficial (001) c-GaN layer, upon which homo-epitaxial growth of c-GaN can be achieved by radio-frequency molecular beam epitaxy. The epitaxial relationship is confirmed by electron microscopy to be (001) c-GaN // (100) β-Ga2O3, [110] c-GaN // [010] β-Ga2O3, and [1-10] c-GaN // [001] β-Ga2O3.

Type
Research Article
Copyright
Copyright © Materials Research Society 2006

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References

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