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Growth of CaFeOX/LaFeO3 Superlattice on SrTiO3(100) Substrates

Published online by Cambridge University Press:  03 March 2011

Nobuyuki Iwata ,
Mark Huijben ,
Guus Rijnders ,
Hiroshi Yamamoto  and
Dave H. A. Blank
Nobuyuki Iwata
Affiliation:
CST, Nihon Univ., 7-24-1 Narashinodai, Funabashi-shi, Chiba 274-8501, Japan
Mark Huijben
Affiliation:
MESA+ Institute for Nanotechnology, Univ. of Twente, 7500AE Enschede, The Netherlands
Guus Rijnders
Affiliation:
MESA+ Institute for Nanotechnology, Univ. of Twente, 7500AE Enschede, The Netherlands
Hiroshi Yamamoto
Affiliation:
CST, Nihon Univ., 7-24-1 Narashinodai, Funabashi-shi, Chiba 274-8501, Japan
Dave H. A. Blank
Affiliation:
MESA+ Institute for Nanotechnology, Univ. of Twente, 7500AE Enschede, The Netherlands
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Abstract

The CaFeOX(CFO) and LaFeO3(LFO) thin films as well as superlattices were fabricated on SrTiO3(100) substrates by pulsed laser deposition (PLD) method. The tetragonal LFO film grew with layer-by-layer growth mode until approximately 40 layers. In the case of CFO, initial three layers showed layer-by-layer growth, and afterward the growth mode was transferred to two layers-by-two layers (TLTL) growth mode. The RHEED oscillation was observed until the end of the growth, approximately 50nm. Orthorhombic twin CaFeO2.5 (CFO2.5) structure was obtained. However, it is expected that the initial three CFO layers are CaFeO3 (CFO3) with the valence of Fe4+. The CFO and LFO superlattice showed a step-terraces surface, and the superlattice satellite peaks in a 2θ-θ and reciprocal space mapping (RSM) x-ray diffraction (XRD) measurements, indicating that the clear interfaces were fabricated.

Keywords

RHEEDlaser ablationthin film
Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1292: Symposium K – Oxide Nanoelectronics , 2011 , mrsf10-1292-k12-16
Copyright
Copyright © Materials Research Society 2011

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References

REFERENCES

1. Huijben, M., Brinkman, A., Koster, G., Rijnders, G., Hilgenkamp, H., and Blank, D. H. A., Adv.Mater. 21, 1665 (2009).Google Scholar
2. Kawasaki, S., Takano, M., Kannno, R., Takeda, T., and Fujimori, A., J. Phys. Soc. Jpn. 67, 1529 (1998).Google Scholar
3. Takeda, Y., Naka, S., Takano, M., Shinjo, T., Takada, T., Shimada, M., Mat. Res. Bull. 13, 61 (1978).Google Scholar
4. Woodward, P. M., Cox, D. E., Moshopoulou, E., Sleight, A. W., Morimoto, S., Phys. Rev. B 62, 844 (2000).Google Scholar
5. Czekaj, S., Nolting, F., Heyderman, L. J., Willmott, P. R., and van der Laan, G., Phys. Rev. B 73, 020401 (2006).Google Scholar
6. Kanamori, J., J. Phys. Chem. Solids 10, 87 (1959).Google Scholar
7. Dann, S. E., Currie, D. B., Weller, M. T., Thomas, M. F., and Al-Rawwas, A. D., J. Solid State Chem. 109, 134 (1994).Google Scholar