Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-25T16:43:53.481Z Has data issue: false hasContentIssue false

Growth and Characterization of Fept Compound thin Films

Published online by Cambridge University Press:  15 February 2011

M.R. Visokay
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA 94305
R. Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford CA 94305
Get access

Abstract

FePt alloy films were deposited at 50 and 49°C onto amorphous SiO2 and single crystal [001] MgO and [0001] Al2O3 using DC magnetron cosputtering, resulting in polycrystalline and [001] and [111] epitaxial films, respectively. High temperature deposition resulted in ordered films with the tetragonal Ll structure and out-of-plane magnetic easy axes while low temperature deposition yielded chemically disordered fcc alloys with in-plane easy axes. Significant modification of the magneto-optic Kerr spectrum is observed for ordered relative to disordered alloys for all orientations. The Kerr rotation has a strong orientation dependence for the ordered, but not disordered films.

Type
Research Article
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Massalski, T.B., Binary Alloy Phase Diagrams, (American Society for Metals, Metals Park, (1986).Google Scholar
2. Ivanov, O.A., Solina, L.V., Demshina, V.A. and Magat, L.M., Phys. Met. Metall., 35, 81 (1973).Google Scholar
3. Men'shikov, A.Z., Dorofeyev, Y.A., Kazantsev, V.A. and Sidorov, S.K., Phys. Met. Metall., 38, 47 (1974).Google Scholar
4. McCurrie, R.A. and Gaunt, P., Phil. Mag., 13, 567 (1966).Google Scholar
5. McCurrie, R.A. and Gaunt, P., Phil. Mag., 19, 339 (1969).Google Scholar
6. Treves, D., Jacobs, J.T. and Sawatzky, E., J. Appl. Phys., 46, 2760 (1975).Google Scholar
7. Visokay, M.R. and Sinclair, R., Appl. Phys. Lett., 66, 1692 (1995).Google Scholar
8. Lairson, B.M., Visokay, M.R., Sinclair, R. and Clemens, B.M., Appl. Phys. Lett., 62, 639 (1993).Google Scholar
9. Lairson, B.M., Visokay, M.R., Marinero, E.E., Sinclair, R. and Clemens, B.M., J. Appl. Phys., 74, 1922 (1993).Google Scholar
10. Cebollada, A., Weller, D., Sticht, J., Harp, G.R., Farrow, R.F.C., Marks, R.F., Savoy, R. and Scott, J.C., Phys. Rev. B, 50, 3419 (1994).Google Scholar
11. Sugimoto, T., Katayama, T., Suzuki, Y., Koide, T., Sidara, T., Yuri, M., Itoh, A. and Kawanishi, K., Phys. Rev. B, 48, 16432 (1993).Google Scholar
12. Farrow, R.F.C., Harp, G., Weller, D., Marks, R.F., Toney, M.F., Cebollada, A. and Rabedeau, T.A., Proc. SPIE, 2140, 106 (1994).Google Scholar
13. Lairson, B.M., Visokay, M.R., Sinclair, R. and Clemens, B.M., Appl. Phys. Lett., 61, 1390 (1992).Google Scholar
14. Farrow, R.F.C., Harp, G.R., Marks, R.F., Rabedeau, T.A., Toney, M.F., Weller, D. and Parkin, S.S.P., J. Cryst. Gr., 133, 47 (1993).Google Scholar
15. Lairson, B.M. and Clemens, B.M., Appl. Phys. Lett., 63, 1438 (1993).Google Scholar
16. Weller, D., Harp, G.R., Farrow, R.F.C., Cebollada, A. and Sticht, J., Phys. Rev. Lett., 72, 2097 (1994).Google Scholar