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Grazing Incidence X-Ray Reflectometry Studies of Cadmium Arachidate Langmuir-Blodgett Films

Published online by Cambridge University Press:  21 February 2011

B. K. Tanner ,
D. K Bowen ,
M. C Petty ,
S. Swaminathan  and
F. Granfeld
B. K. Tanner
Affiliation:
Dept. of Physics, University of Durham, South Road, Durham, DH1 3LE, U.K.
D. K Bowen
Affiliation:
Dept. of Engineering, University of Warwick, Coventry, CV7 4AL, U.K.
M. C Petty
Affiliation:
School of Engineering and Computer Science, University of Durham, South Road Durham DH1 3LE, U.K.
S. Swaminathan
Affiliation:
Dept. of Engineering, University of Warwick, Coventry, CV7 4AL, U.K.
F. Granfeld
Affiliation:
NIMA Technology, University of Warwick Science Park, Coventry, U.K
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Abstract

Grazing incidence X-ray reflectometry has been used to characterize Langmuir-Blodgett films of cadmium arachidate deposited on silicon substrates. The agreement between layer parameters deduced from the interference fringe period and low angle Bragg peak positions was excellent. Good agreement was found between experimental and simulated reflectivity profiles only when interface roughness and a varying molecular layer thickness was included. Inclusion of interface roughness alone results in a substantial enhancement in the intensity of the Bragg peaks. This effect is identified as being equivalent to the reduction in extinction found in classical X-ray diffraction due to crystal imperfections.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 237: Symposium Ca – Interface Dynamics and Growth , 1991 , 281
Copyright
Copyright © Materials Research Society 1992

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References

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