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Grain-Oriented Lithium Niobate Thin-Layers Prepared by Sol-Gel Methods

Published online by Cambridge University Press:  16 February 2011

Daniel S. Hagberg  and
D. A. Payne
Daniel S. Hagberg
Affiliation:
Department of Materials Science and Engineering, and the Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
D. A. Payne
Affiliation:
Department of Materials Science and Engineering, and the Beckman Institute for Advanced Science and Technology, University of Illinois at Urbana-Champaign, Urbana, IL 61801.
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Abstract

Thin-layers of lithium niobate were deposited on polycrystalline platinum and (001) sapphire. Preferred orientation was observed by x-ray diffraction measurements, and confirmed by x-ray rocking curve studies. The orientation was [006] LiNbO3 with [111] Pt and [001] Al2O3. Dielectric data are reported for grain oriented LiNbO3 as a function of frequency for layer thicknesses from 0.15 to 0.70 μm.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 200: Symposium Y – Ferroelectric Thin Films I , 1990 , 19
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1. Miyazawa, S., Appl. Phys. Lett. 23 (4), 198 (1973).Google Scholar
2. Betts, R. A. and Pitt, C. W., Electronics Letters 21 (21), 960 (1985).Google Scholar
3. Hewig, G. H., et al., Thin Solid Films 88, 67 (1982).Google Scholar
4. Kanata, T., et al., J. Appl. Phys. 62 (7), 2989 (1987).Google Scholar
5. Meek, P. R., et al., Thin Solid Films 141, 251 (1986).Google Scholar
6. Eichorst, D. J. and Payne, D. A., in Better Ceramics Through Chemistry III, MaL Res. Soc. Symp. Proc., 121, 773 (1988).Google Scholar
7. Yanovskaya, M. I., et al., J. Mat. Sci., 23, 395 (1988).Google Scholar
8. Hirano, S. I. and Kato, K., Adv. Ceram. Mat. 3, 503 (1988).Google Scholar
9. Partlow, D. P. and Greggi, J., J. Mater. Res. 2, 595 (1987).Google Scholar
10. Eichorst, D. J. (private communication).Google Scholar
11. Eichorst, D. J., et al., to appear in Inorg. Chem 29 (8), 1990.Google Scholar
12. ASTM card number 20–631.Google Scholar
13. Weis, R. S. and Gaylord, T. K., Appl. Phys. A 37, 191 (1985).Google Scholar