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Grain Boundary Segregation and Thermal History Effects on Properties of La1.85Sr0.15CuO4-y Superconductors

Published online by Cambridge University Press:  28 February 2011

Yet-Ming Chiang
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Alexana Roshko
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Brian D. Fabes
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Dominic K. Leung
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Jeri Ann S. Ikeda
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
David A. Rudman
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
Michael J. Parker
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
John R. Martin
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, MA 02139
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Abstract

The grain boundary segregation of Sr in the La1.85Sr0.15CuO4-y system, and its effects on polycrystalline diamagnetic properties, have been characterized. Equilibration at 1000°C reduces grain boundary segregation compared to that which is present at 700°C. Results indicate that critical currents in randomly oriented polycrystalline materials will be improved if annealing treatments can be optimized to minimize grain boundary segregation without degrading lattice oxygen stoichiometry.

Type
Research Article
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1. Dinger, T.R., et al., Phys. Rev. Lett. 58, 2687 (1987).Google Scholar
2. Chaudhari, P., et al., Phys. Rev. Lett. 58 2684 (1987).Google Scholar
3. Ekin, J.W., Advanced Ceramic Materials, 2[3B], 586 (1987).Google Scholar
4. Ekin, J.W., et al., submitted to J. Appl. Phys.Google Scholar
5. Finnemore, D.K., et al., Phys. Rev. B 35[10], 5319 (1987).Google Scholar
6. Finnemore, D.K., et al., submitted to ICMC, June 12, 1987.Google Scholar
7. Farrell, D.E., et al., Phys. Rev. B, 35[16], 8797 (1987).Google Scholar
8. DeGuire, M.R., Farrell, D.E., Adv. Cer. Mat. 2, 593 (1987).Google Scholar
9. Kwak, J.F., Venturini, E.L., Ginley, D.S., Fu, W., submitted.Google Scholar
10. Senoussi, S., et al., submitted to Phys. Rev. B.Google Scholar
11. McHenry, M.E., et al., submitted to Phys. Rev.Google Scholar
12. Chiang, Y.-M., et al., submitted to Phys. Rev. B.Google Scholar
13. Tarascon, J. M., et al., Science 235, 1373 (1987).Google Scholar
14. van Dover, R.B., et al., Phys. Rev. B 35, 5337 (1987).Google Scholar