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Grain Boundary Chemical Analysis Using Intense Electron Beams
Published online by Cambridge University Press: 10 February 2011
Abstract
Scanning Transmission Electron Microscope (STEM) Energy Dispersive X-Ray analysis (EDX) linescans and mapping have been used to examine the large angle grain boundary chemistry of Ni-rich Ni3AI both with and without boron. The results show that the Al content is reduced while the Ni content is unchanged at the grain boundaries in all these alloys, with the percentage of reduction of Al at the grain boundaries decreasing as boron concentration increases. This is ascribed to differential surface sputtering of the lighter Al atoms.
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- Copyright © Materials Research Society 1999
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