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Grain Boundary Chemical Analysis Using Intense Electron Beams

Published online by Cambridge University Press:  10 February 2011

P. Shang
Affiliation:
School of Metallurgy and Materials
R. Keyse
Affiliation:
Department of Materials Science and Engineering, The University of Liverpool, Liverpool L69 3BX, UK
I. P Jones
Affiliation:
School of Metallurgy and Materials IRC in Materials for High Performance Applications The University of Birmingham, Birmingham B15 2TT UK
R. E. Smallman
Affiliation:
School of Metallurgy and Materials
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Abstract

Scanning Transmission Electron Microscope (STEM) Energy Dispersive X-Ray analysis (EDX) linescans and mapping have been used to examine the large angle grain boundary chemistry of Ni-rich Ni3AI both with and without boron. The results show that the Al content is reduced while the Ni content is unchanged at the grain boundaries in all these alloys, with the percentage of reduction of Al at the grain boundaries decreasing as boron concentration increases. This is ascribed to differential surface sputtering of the lighter Al atoms.

Type
Research Article
Copyright
Copyright © Materials Research Society 1999

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References

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