Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by
Crossref.
Binari, S.C.
1999.
GaN electronic devices for future systems.
Vol. 3,
Issue. ,
p.
1081.
Sheppard, S.T.
Doverspike, K.
Pribble, W.L.
Allen, S.T.
Palmour, J.W.
Kehias, L.T.
and
Jenkins, T.J.
1999.
High-power microwave GaN/AlGaN HEMTs on semi-insulating silicon carbide substrates.
IEEE Electron Device Letters,
Vol. 20,
Issue. 4,
p.
161.
Piquette, E. C.
Bridger, P. M.
Bandić, Z. Z.
and
McGill, T. C.
1999.
Morphology, polarity, and lateral molecular beam epitaxy growth of GaN on sapphire.
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena,
Vol. 17,
Issue. 3,
p.
1241.
Pearton, S. J.
Zolper, J. C.
Shul, R. J.
and
Ren, F.
1999.
GaN: Processing, defects, and devices.
Journal of Applied Physics,
Vol. 86,
Issue. 1,
p.
1.
Smart, J. A.
Schremer, A. T.
Weimann, N. G.
Ambacher, O.
Eastman, L. F.
and
Shealy, J. R.
1999.
AlGaN/GaN heterostructures on insulating AlGaN nucleation layers.
Applied Physics Letters,
Vol. 75,
Issue. 3,
p.
388.
Han, J.
Baca, A. G.
Shul, R. J.
Willison, C. G.
Zhang, L.
Ren, F.
Zhang, A. P.
Dang, G. T.
Donovan, S. M.
Cao, X. A.
Cho, H.
Jung, K. B.
Abernathy, C. R.
Pearton, S. J.
and
Wilson, R. G.
1999.
Growth and fabrication of GaN/AlGaN heterojunction bipolar transistor.
Applied Physics Letters,
Vol. 74,
Issue. 18,
p.
2702.
Alekseev, E.
Eisenbach, A.
and
Pavlidis, D.
1999.
Low interface state density AlN/GaN MISFETs.
Electronics Letters,
Vol. 35,
Issue. 24,
p.
2145.
Klein, P. B.
Freitas, J. A.
Binari, S. C.
and
Wickenden, A. E.
1999.
Observation of deep traps responsible for current collapse in GaN metal–semiconductor field-effect transistors.
Applied Physics Letters,
Vol. 75,
Issue. 25,
p.
4016.
Micovic, M.
Nguyen, N.X.
Janke, P.
Wong, W.-S.
Hashimoto, P.
McCray, L.-M.
and
Nguyen, C.
2000.
GaN/AlGaN high electron mobility transistors with f of 110 GHz.
Electronics Letters,
Vol. 36,
Issue. 4,
p.
358.
Klein, P. B.
Binari, S. C.
Freitas, J. A.
and
Wickenden, A. E.
2000.
Photoionization spectroscopy of traps in GaN metal-semiconductor field-effect transistors.
Journal of Applied Physics,
Vol. 88,
Issue. 5,
p.
2843.
Pearton, S.J.
Ren, F.
Zhang, A.P.
Dang, G.
Cao, X.A.
Lee, K.P.
Cho, H.
Gila, B.P.
Johnson, J.W.
Monier, C.
Abernathy, C.R.
Han, J.
Baca, A.G.
Chyi, J.-I.
Lee, C.-M.
Nee, T.-E.
Chuo, C.-C.
and
Chu, S.N.G.
2001.
GaN electronics for high power, high temperature applications.
Materials Science and Engineering: B,
Vol. 82,
Issue. 1-3,
p.
227.
Luo, B.
Mehandru, R.
Kim, J.
Ren, F.
Gila, B. P.
Onstine, A. H.
Abernathy, C. R.
Pearton, S. J.
Fitch, R.
Gillespie, J.
Jenkins, T.
Sewell, J.
Via, D.
Crespo, A.
and
Irokawa, Y.
2002.
Comparison of Surface Passivation Films for Reduction of Current Collapse in AlGaN/GaN High Electron Mobility Transistors.
Journal of The Electrochemical Society,
Vol. 149,
Issue. 11,
p.
G613.
Moore, Karen
2002.
RF and Microwave Semiconductor Device Handbook.
Chiu, Hsien-Chin
Yang, Chih-Wei
Wang, Hsiang-Chun
and
Huang, Fan-Hsiu
2015.
Microwave wide bandgap GaN high electron mobility transistor development and its monolithic integrated circuits (Invited).
p.
1.
Zhao, Ziyue
Lu, Yang
Zhang, Hengshuang
Yi, Chupeng
Wang, Yuchen
Ma, Xiaohua
and
Hao, Yue
2020.
Highly accurate GaN HEMT model based on the Angelov model with error compensation.
Microwave and Optical Technology Letters,
Vol. 62,
Issue. 11,
p.
3505.