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GaN Materials for High Power Microwave Amplifiers

Published online by Cambridge University Press:  10 February 2011

Lester F. Eastman
Affiliation:
School of Electrical Engineering, Cornell University, Ithaca, NY, 14853-5401, [email protected], [email protected]
Kenneth chu
Affiliation:
School of Electrical Engineering, Cornell University, Ithaca, NY, 14853-5401, [email protected], [email protected]
Joseph smart
Affiliation:
School of Electrical Engineering, Cornell University, Ithaca, NY, 14853-5401, [email protected], [email protected]
J. Richard Shealy
Affiliation:
School of Electrical Engineering, Cornell University, Ithaca, NY, 14853-5401, [email protected], [email protected]
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Abstract

The key parameters of GaN for use in microwave power amplifiers are presented. The electron-scattering effect of dislocations are presented for 2 DEG in HEMT devices. The use of the piezoelectric effect in designing Aly Ga1-yN/GaN HEMT structures is reviewed for a range of y.Short-gate device fabrication methods, and the device characterization, are presented. Maximum frequency of oscillation for .15 μm gates reached 140 GHz, while .3 μm gate power amplifiers reached 74% power-added efficiency at 3 GHz.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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References

REFERENCES

1. Weimann, N., Eastman, L. F., Doppalapudi, P., Ng, H. M., and Moustakas, T. D., Journal of Applied Physics, 83, 7, (1 April 1998).Google Scholar
2. Ridley, B. K.; private communication.Google Scholar
3. Mishra, U.; private communication.Google Scholar
4. Gradinaru, G., Khan, M. A., Kav, N. C., and Serdarshan, T. S., Applied Physics Letters, 72, 12 ( 23 March 1998).Google Scholar