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Fundamentals of Energy Beam Interactions with Solids

Published online by Cambridge University Press:  22 February 2011

W. L. Brown
W. L. Brown*
Affiliation:
AT&T Bell Laboratories, Murray Hill, NJ 07974
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Abstract

High intensity pulsed beams of photons, electrons and ions provide extremely efficient means for electronically exciting solids near their surfaces. Among these three, laser beams with ever-increasing time resolution have also served as diagnostic probes to clarify the picosecond time scale on which interchange of energy between the electronic and the vibrational states of solids takes place at very high excitation energy densities. Because of this rapid transfer of electronic excitation to heat, pulsed beams provide versatile tools to investigate transient thermodynamic phenomena in solids, particularly those associated with metastable phases such as amorphous silicon.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 23 , 1983 , 9
Copyright
Copyright © Materials Research Society 1984

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References

REFERENCES

1. See for example “Laser Solid Interactions and Transient Thermal Processing of Materials”, Narayan, J., Brown, W. L. and Lemons, R. A., eds. (Nortn-Holland, New York 1983).Google Scholar
2.Mayer, J. W., 1983 MRS Symposium on Energy Beam Solid Interactions and Transient Thermal Processing.Google Scholar
3.Gibbons, J. F., 1983 MRS Symposium on Energy Beam Solid Interactions and Transient Thermal Processing.Google Scholar
4.Brown, W. L., Golovenenko, J. A., Jackson, K. A., Kimerling, L. C., Leamy, H. J., Miller, G. L., Poate, J. M., Rodgers, J. W., Rozgonyi, G. A., Intl. Conf. Rapid Solidification,1977.(669.94/1617R) 111211;Google Scholar
4a.Venkatesan, T. N. C., Golovenenko, J. A., Poate, J. M., Cowan, P. and Celler, G. K., Appl. Pnys. Lett., 33, 429 (1978).Google Scholar
5.Young, R. T., Wnite, C. W., Narayan, J., IEEE Photovolt Spec. Conf., p. 1208, 1978, (535.8/Ill) 170617;Google Scholar
5a.Wnite, C. W., Christie, W. H., Appleton, B. R., Appl. Phys. Lett. 33, 662 (1978).Google Scholar
6.Auston, D. H., Surko, C. M., Venkatesan, T. N. C., Slusner, R. E., Golovenenko, J. A., Appl. Phys. Lett., 33, 437, 1978.Google Scholar
7.Van Veenten, J. A., Tsu, R., Saris, F. W., Phys. Lett. A, 74A, 422, 1979.Google Scholar
8.Liu, P. L., Yen, R., Bloembergen, N. and others, Appl. Phys. Lett., 34, 864, 1979.Google Scholar
9.Snank, C. V., Yen, R. and Hirlimann, C., Phys. Rev. Lett., 50, 454, 1983.Google Scholar
10.Lee, M. C., Lo, H. W., Aydinli, A., Trott, G. J., Compaan, A. and Hale, E. B., Solid State Comm., 46, 677, 1983.Google Scholar
11.Lowndes, D. H., Jellison, G. E., and Wood, R. F., Phys. Rev. B 26, 4747 (1982).Google Scholar
12.Lyon, S. A., Cnen, Y. H., Flin, J. and Worlock, J. M., Appl. Pnys. Lett., 42, 978, 1983.Google Scholar
13.Lompré, L. A., Liu, J. M., Kurt, H. and Bloembergen, N., Appl. Phys. Lett., 43, 168, 1983, and to be published Appl. Phys. Lett. Jan. 1984.Google Scholar
14.Fauchet, P. M. and Siegman, A. E., Appl. Phys. Lett, 43, 1045 (1983);Google Scholar
14a. 1983 MRS Symposium on Energy Beam Solid Interactions and Transient Thermal Processing.Google Scholar
15.Bucksbaum, P. H. and Bokor, J. in Laser-Solid Interactions and Transient Thermal Processing of Materials, Narayan, J., Brown, W. L. and Lemons, R. A., eds. (North-Holland, New York, 1983), p. 51. 1983 MRS Symposium on Energy Beam Solid Interactions and Transient Thermal Processing.Google Scholar
16.Murakami, K., Itoh, H., Takita, K. and Masuoa, K., Pnysica, 117B and 118B 1024, 1983.Google Scholar
17.Van Driel, H. M., to be published.Google Scholar
18.Compaan, A., Lo, H. W., Aydinli, A. and Lee, M. C. in Laser Solid Interactions and Transient Thermal Processing of Materials, Narayan, J., Brown, W. L., Lemons, R. A., eds. (Norto-Holland, New York 1983), p. 23.Google Scholar
18a.Compaan, A., Lee, M. C., Lo, H. W., Trott, G. and Aydinli, A., J. Appl. Phys., 514, 5950, 1983.Google Scholar
19.Von Der Linde, D., Wartmann, G., Kemmler, M. and Znu, Z. H., 1983 MRS Symposium on Energy Beam Solid Interactions and Transient Thermal Processing;Google Scholar
19a.Von Der Linde, D. and Wartmann, G. and Ozols, A. in Laser-Solid Interactions and Transient Thermal Processing of Materials, Narayan, J., Brown, W. L., and Lemons, R. A., eds. (Norto-Holland, New York 1983), p. 17.Google Scholar
20.Shank, C. V., Yen, R. and Hirlimann, C., Phys. Rev. Lett., 51, 900 (1983).Google Scholar
21.Larson, B. C., White, C. W., Noggle, T. S., Barhorst, J. F. and Mills, D. M., Appl. Phys. Lett., 42, 282 (1983).Google Scholar
22.Thompson, M. O., Galvin, G. J., Mayer, J. W., Peercy, P. S. and Hammond, R. B., Appl. Phys. Lett., 42, 445 (1983).Google Scholar
23.Tnompson, M. O., Mayer, J. W., Cullis, A. G., Webber, H. C., Chew, N. G., Poate, J. M. and Jacobson, D. C., Phys. Rev. Lett., 50, 896 (1983).Google Scholar
24.Pospieszczyk, A., Abdek Haritn, M. and Stritzker, B., J. Appl. Phys. 54, 3177 (1983).Google Scholar
25.Baltzer, N., Von Allmen, M. and Sigrist, M. W., Appl. Phys. Lett., 43, 826 (1983).Google Scholar
26.Becker, R. S., Higashi, G. S. and Golovehenko, J. A., to be published in Phys. Rev. Lett.Google Scholar
27.Baglin, J. E. E., Hodgson, R. T., Neri, J. M. and Fastow, R., Appl. Phys. Lett., 43, 299 (1983).Google Scholar
28.Miyao, M., Notooka, T., Natsuaki, N. and Tokuyama, T., Laser and Electron-Beam Solid Interactions and Materials Processing, Gibbons, J. F., Hess, L. D. and Sigmon, T. W., eds. (North-Holland, New York, 1981), pg. 163.Google Scholar
29.Liu, P. L., Yen, R. and Bloembergen, N., Hodgson, R. T., in Laser and Electron Beam Processing of Materials, White, C. W. and Peercy, P. S., eds. (Academic Press, Inc., New York 1980), pg. 156.Google Scholar
29a. See also. Brown, W. L., Ibid., pg. 30.Google Scholar
30.Fastow, R. M., Gyulai, J., and Mayer, J. W., in Laser Solid Interactions and Transient Thermal Processing of Materials, Narayan, J., Brown, W. L., and Lemons, R. A., eds. (North-Holland, New York, 1983), pg. 69;Google Scholar
30a.Gyulai, J., Fastow, R., Kavanagh, K., Thompson, M. O., Palmstrom, C. J., Hewett, C. A. and Mayer, J. W., Ibid., pg. 455.Google Scholar
31.Narayan, J. and White, F. W. Jr., Appl. Phys. Lett., 35, 330 (1979).Google Scholar
32.Baeri, P., Poate, J. M., Campisano, S. U., Foti, G., Rimini, E. and Cullis, A. G., Appl. Pnys. Lett., 37, 912 (1980).Google Scholar
33.Donovan, E. P., Spaepen, F., Turnbull, D., Poate, J. M. and Jacobson, D. C., Appl. Pnys. Lett., 42, 698 (1983).Google Scholar
34.Thompson, M. O., Galvin, G. J., Mayer, J. W., Peercy, P. S., Poate, J. M., and Jacobson, D. C., submitted for publication.Google Scholar
35.Leamy, H. J., Brown, W. L., Celler, G. K., Foti, G., Gilmer, G. H., and Fan, J. C. C., Appl. Phys. Lett., 38, 137 (1981).Google Scholar
36.Narayan, J. and Wnite, C. W., to be publisned, Appl. Phys. Lett., Jan. 1984.Google Scholar