Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-25T18:54:26.408Z Has data issue: false hasContentIssue false

Formation and Stabilization of Extended Defects in Zirconia Titanate Microwave Ceramics

Published online by Cambridge University Press:  25 February 2011

Roy Christoffersen
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut St., Philadelphia, PA 19104-6272
Peter K. Davies
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, 3231 Walnut St., Philadelphia, PA 19104-6272
Get access

Abstract

The low-temperature, Zr/Ii ordered, form of zirconium titanate has been investigated using high-resolution transmission electron microscopy in order to characterize the incommensurate structure of phases with compositions ZrTiO4 to near Zr5Ti7O24. Electron diffraction reveals that compositions with Zr:Ti between 5:7 and 1:1 have incommensurate superstructures, and phases close to 1:1 are commensurate with an a-axis repeat 2× that of the disordered structure. High-resolution images show that the a-doubling in ZrTiO4 corresponds to a new structure, one that consists of two Zr-rich, distorted octahedral layers alternated with two Ti-rich octahedral layers. The incommensurate compositions are composed of blocks of the 1:1 structure intercalated with blocks of the commensurate 5:7 structure, the latter having a tripled a-repeat and a ZTTZTT sequence of cation layers. The intercalation can be described as an “interface-modulated” structure resulting from the quasi-periodic insertion of (100) faults with displacement vector ℝ= -l/3aord in the ordered 5:7 phase. Although their spacing is variable, the faults are uniformly distributed in such a way as to produce incommensurate satellite reflections.

Type
Research Article
Copyright
Copyright © Materials Research Society 1992

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Moulson, A. J. and Herbert, J. M., Electroceramics, 1st ed. (Chapman and Hall, London, 1990), p. 239.Google Scholar
2. Negas, T., Yeager, G., Bell, S., and Amren, R., in Chemistry of Electronic Ceramic Materials, edited by Davies, P.K. and Roth, R.S. (NIST Spc. Publ. 804, Washington, D.C., 1990) pp. 2138.Google Scholar
3. Newnham, R. E., J. Am. Chem. Soc. 50, 216 (1967).Google Scholar
4. Bordet, P., McHale, A., Santoro, A., and Roth, R. S., J. Solid State Chem. 64, 30 (1986).Google Scholar
5. McHale, A. E. and Roth, R. S., J. Am. Cer. Soc. 69, 827 (1986).Google Scholar
6. McHale, A. E. and Roth, R. S., J. Am. Cer. Soc. 66, C18 (1983).Google Scholar
7. Wolfram, G. and Gobel, H. E., Mater. Res. Bull., 16, 1455 (1981).Google Scholar
8. Fujiwara, K., J. Phys. Soc. Jpn. 12, 7 (1957).Google Scholar
9. Cowley, J. M., Diffraction Physics, (Elsevier Science Publishers, New York, 1984), p. 384.Google Scholar
10. Christoffersen, R. and Davies, P.K., J. Am. Cer. Soc., in press.Google Scholar
11. Landuyt, J. Van, Ridder, R. De, Gevers, R., and Amelinckx, S., Mater. Res. Bull. 5, 353 (1970).Google Scholar
12. Franzen, H. F., Physical Chemistry of Inorganic Crystalline Solids, (Springer-Verlag, New York, 1986), p. 116.Google Scholar
13. Hirano, S., Hayashi, T., and Hattori, A., J. Am. Cer. Soc. 74, 1320 (1991).Google Scholar
14. Galasso, F., and Pyle, J., In. Chem., 2 482 (1963).Google Scholar
15. Matsumoto, K., Hiuga, T., Takada, K., and Ichimura, H., Proc. 6th IEEE International Symposium on Application of Ferroelectrics (1986) pp. 118.Google Scholar
16. Kawashima, S., Nishida, M., Ueda, I., and Ouchi, H., J. Am. Cer. Soc., 66, 421 (1983).Google Scholar