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Formation and Properties of Silicon/Silicide/Oxide Nanochains

Published online by Cambridge University Press:  01 February 2011

Hideo Kohno ,
Yutaka Ohno ,
Satoshi Ichikawa ,
Tomoki Akita ,
Koji Tanaka  and
Seiji Takeda
Hideo Kohno
Affiliation:
Department of Physics, Graduate School of Science, Osaka University, 1–16 Machikaneyama, Toyonaka, Osaka 560–0043, JAPAN
Yutaka Ohno
Affiliation:
Department of Physics, Graduate School of Science, Osaka University, 1–16 Machikaneyama, Toyonaka, Osaka 560–0043, JAPAN
Satoshi Ichikawa
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST Kansai), 1–8–31 Midorigaoka, Ikeda, Osaka 563–8577, JAPAN
Tomoki Akita
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST Kansai), 1–8–31 Midorigaoka, Ikeda, Osaka 563–8577, JAPAN
Koji Tanaka
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST Kansai), 1–8–31 Midorigaoka, Ikeda, Osaka 563–8577, JAPAN
Seiji Takeda
Affiliation:
Department of Physics, Graduate School of Science, Osaka University, 1–16 Machikaneyama, Toyonaka, Osaka 560–0043, JAPAN
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Abstract

Silicon/silicide/oxide nanochains, which have an alternate arrangement of silicon/copper silicide composite nanoparticles and oxide nanowires, were fabricated using silicon/oxide nanochains as templates. Photoluminescence was observed at room temperature and considered to be due to recombination of excitons in oxide. Electrostatic potential in the material was also investigated by electron holography. No visible potential bending at the silicon/silicide interface was detected.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 789 , 2003 , N11.18
Copyright
Copyright © Materials Research Society 2004

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References

REFERENCES

1. Wu, Y., Fan, R. and Yang, P., Nano Lett. 2, 83 (2002).Google Scholar
2. Hu, J., Ouyang, M., Yang, P. and Lieber, C. M., Nature 399, 48 (1999).Google Scholar
3. Gudiksen, M. S., Lauhon, L. J., Wang, J., Smith, D. C. and Lieber, C. M., Nature 415, 617 (2002).Google Scholar
4. Frabboni, S., Matteucci, G., Pozzi, G. and Vanzi, M., Phys. Rev. Lett. 55, 2196 (1985).Google Scholar
5. McCartney, M. R., Ponce, F. A., Cai, J. and Bour, D. P., Appl. Phys. Lett. 76, 3055 (2000).Google Scholar
6. Ichikawa, S., Akita, T., Okumura, M., Haruta, M., Tanaka, K. and Kohyama, M., J. Electron. Microsc. 52, 21 (2003).Google Scholar
7. Kohno, H. and Takeda, S, Appl. Phys. Lett. 73, 3144 (1998).Google Scholar
8. Kohno, H., Takeda, S. and Iwasaki, T., Mater. Res. Soc. Symp. Proc. 571, 293 (2000).Google Scholar
9. Kohno, H., Takeda, S. and Tanaka, K., J. Electron Microsc. 49, 275 (2000).Google Scholar
10. Kohno, H. and Takeda, S., J Crystal Growth 216, 185 (2000).Google Scholar
11. Kohno, H., Iwasaki, T., and Takeda, S., Solid Sate Commun. 116, 591 (2000).Google Scholar
12. Kohno, H., Tanaka, K. and Takeda, S., Mater. Res. Symp. Proc. 638, F13.3.1 (2001).Google Scholar
13. Kohno, H., Iwasaki, T., Mita, Y., Kobayashi, M., Endo, S. and Takeda, S., Phisica B 308–310, 1097 (2001).Google Scholar
14. Kohno, H., Iwasaki, T. and Takeda, S., Mater. Sci. Eng. B 96, 76 (2002).Google Scholar
15. Kohno, H. and Takeda, S., Appl. Phys. Lett. 83, 1202 (2003).Google Scholar
16. Wagner, R. S. and Ellis, W.C., Appl. Phys. Lett. 4, 89 (1964).Google Scholar
17. Ozaki, N., Ohno, Y., and Takeda, S., Appl. Phys. Lett. 73, 3700 (1998).Google Scholar
18. Ohno, Y. and Takeda, S., Rev. Sci. Instr. 66, 4866 (1995).Google Scholar
19. Ohno, Y. and Takeda, S., J. Electron Microsc. 51, 281 (2002).Google Scholar
20. Solberg, J. K., Acta Cryst. A 34, 684 (1978),Google Scholar
21. Itoh, C., Suzuki, T. and Itoh, N., Phys. Rev. B 41, 3794 (1990).Google Scholar
22. Tanimura, K., Itoh, C. and Itoh, N., J. Phys. C 21, 1869 (1998).Google Scholar
23. Gajdardziska-Josifovska, M. amd Carim, A. H., “Applications of electron holography”, Introduction to electron holography, ed. Völkl, E., Allard, L. F. and Joy, D. C. (Kluwer, 1999) pp267–293.Google Scholar