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Fluorescence Yield Near Edge Spectroscopy (Fynes) for Ultra Low Z Materials: an In-Situ Probe of Reaction Rates and Local Structure

Published online by Cambridge University Press:  21 February 2011

D. A. Fischer ,
J. L. Gland  and
G. Meitzner
D. A. Fischer
Affiliation:
Exxon PRT, Bldg. 510E, Brookhaven National Laboratory, Upton, NY 11973
J. L. Gland
Affiliation:
Chemistry Dept., University of Michigan, Ann Arbor, MI 48109
G. Meitzner
Affiliation:
Exxon Research and Engineering Co., Annandale, NJ 08801
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Abstract

Fluorescence Yield Near Edge Spectroscopy (FYNES) of ultra low Z materials represents a synchrotron radiation milestone for in-situ determination of local structure for a range of materials problems from monolayers to bulk samples even in the presence of a reactive atmosphere. Two examples will be presented highlighting the broad range of materials problems addressed by the FYNES technique. First a study of the kinetics of CO displacement on Ni(100) by hydrogen at pressures up to.1 torr. These kinetic results highlight the unique capabilities of FYNES to directly characterize surface reaction rates in the presence of reactive gases. Second, a pioneering fluorescence EXAFS study characterizing low concentration fluorine materials will be discussed. Finally new opportunities in FYNES presented by increased photon flux from insertion-device- based sources will be explored.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 143: Symposium V – Synchrotron Radiation in Materials Research , 1988 , 139
Copyright
Copyright © Materials Research Society 1989

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References

1. Stohr, J., in “Principles, Techniques, and Applications of EXAFS, SEXAFS, and XANES,” Prins, R. and Konigsberger, D. C., eds., John Wiley, New York, 1985.Google Scholar
2. Stohr, J., Kollin, E. B., Fischer, D. A., Hastings, J. B., Zaera, F., and Sette, F., Phys. Rev. Lett. 55. 1468 (1985).Google Scholar
3. Fischer, D. A., Dobler, U., Arvanitis, D., Wenzel, L., Baberschke, K. and Stohr, J., Surf. Sci. 177. 144 (1986).Google Scholar
4. Fischer, D. A., Colbert, J., and Gland, J. L., Rev. Sci. Instr. March/April (1989).Google Scholar
5. Zaera, F., Fischer, D. A., Shen, S., Gland, J. L., Surf. Sci. 194, 205 (1988).Google Scholar
6. Tracy, J. C., J. Chem. Phys. 56, 2736 (1971).Google Scholar
7. Tracy, J. C. and Burkstrand, J. M., CRS Crit, Rev. in Solid St. Sci. 4, (1974), Issue 3, 381.Google Scholar
8. Christmann, K., Schober, O., Ertle, G., Neumann, M., J. Chem. Phys. 60, 4528 (1974).Google Scholar
9. Henke, B. and Tester, M. in Advances in X-ray Analysis, Vol. 18, Plenum Press (1975).Google Scholar
10. Stohr, J. and Jaeger, R., Phys. Rev. B 26, 4111 (1982).Google Scholar