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Fdtd Simulations And Analysis Of Thin Sample Dielectric Properties Measurements Using Coaxial Probes

Published online by Cambridge University Press:  10 February 2011

S. Bringhurst ,
M. F. Iskander  and
M. J White
S. Bringhurst
Affiliation:
Electrical Engineering Department, University of Utah, Salt Lake City, UT 84112
M. F. Iskander
Affiliation:
Electrical Engineering Department, University of Utah, Salt Lake City, UT 84112
M. J White
Affiliation:
Electrical Engineering Department, University of Utah, Salt Lake City, UT 84112
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Abstract

A metallized ceramic probe has been designed for high temperature broadband dielectric properties measurements. The probe was fabricated out of an alumina tube and rod as the outer and inner conductors respectively. The alumina was metallized with a 3 mil layer of moly-manganese and then covered with a 0.5 mil protective layer of nickel plating. The probe has been used to make complex dielectric properties measurements over the complete frequency band from 500 MHz to 3 GHz, and for temperatures as high as 1000 °C.

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 430: Symposium O – Microwave Processing of Materials V , 1996 , 237
Copyright
Copyright © Materials Research Society 1996

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References

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