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Fatigue in PZT Thin Films
Published online by Cambridge University Press: 21 March 2011
Abstract
We have used the new approach to fatigue phenomenon for analysis of the switching current and C-V characteristic evolution during cycling in PZT thin films. It was shown that in accordance with theoretical predictions the rejuvenation stage precedes the fatigue one. We have demonstrated that fatigue behavior corresponds to the spreading of the internal bias field distribution function during ac switching.
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- Copyright © Materials Research Society 2001
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