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Fast X-ray Measurement System for Structural Study in Zr60Al15Ni25 Supercooled Liquid
Published online by Cambridge University Press: 10 February 2011
Abstract
A fast x-ray measurement system adopting the geometry of the Debye-Scherrer camera in combination with an imaging plate has been developed for the structural study of supercooled liquid. We carried out the anomalous x-ray scattering (AXS) measurement as well as the ordinary x-ray diffraction measurement with this system in Zr60Al15Ni25 supercooled liquid at 720K above the glass transition temperature (693K). A whole diffraction profile of very good counting statistics that even fits to the AXS analyses is obtained for a very short time (≅600s). The analyses of scattering data observed in the Zr60Al15Ni25 supercooled liquid for various annealing times in this system provide us information on a change of local atomic structures in the liquid state.
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- Copyright © Materials Research Society 1999
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