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Fabrication of Molecular Micro-NanoStructures by Surface-Tension-Driven Technique

Published online by Cambridge University Press:  17 March 2011

Ilenia Viola
Affiliation:
National Nanotechnology Laboratory (NNL) of INFM-CNR, Lecce, 73100, Italy
Fabio Della Sala
Affiliation:
National Nanotechnology Laboratory (NNL) of INFM-CNR, Lecce, 73100, Italy
Manuel Piacenza
Affiliation:
National Nanotechnology Laboratory (NNL) of INFM-CNR, Lecce, 73100, Italy
Laura Favaretto
Affiliation:
ISOF of CNR, Bologna, 40129, Italy
Massimo Gazzano
Affiliation:
ISOF of CNR, Bologna, 40129, Italy
Giovanna Barbarella
Affiliation:
ISOF of CNR, Bologna, 40129, Italy
Roberto Cingolani
Affiliation:
National Nanotechnology Laboratory (NNL) of INFM-CNR, Lecce, 73100, Italy
Giuseppe Gigli
Affiliation:
National Nanotechnology Laboratory (NNL) of INFM-CNR, Lecce, 73100, Italy
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Extract

We present the fabrication of a pixels structure by a well-defined pattern replication of a micrometer template driven by a surface free-energy lithographic technique, realized by molecular aggregation in dewetting conditions and by confining the liquid solution with geometric boundaries. The organization in the solid-state of the selected thiophene-based molecular materials allows to realize a bicoloured, green and red-emitting pixels structure, by exploiting the molecular structural arrangement, induced during a dewetting process, and the great conformational flexibility of DTT7Me.

Type
Research Article
Copyright
Copyright © Materials Research Society 2007

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References

[1] Leclere, Ph., Surin, M., Viville, P., Lazzaroni, R., Kilbinger, A.F.M., Henze, O., Feast, W.J., Cavallini, M., Biscarini, F., Schenning, A., Meijer, E., Chem. Mater., 2004, 16, 4452.Google Scholar
[2] Loi, M.A., Como, E. Da, Dinelli, F., Murgia, M., Zamboni, R., Biscarini, F., Muccini, M., Nature Mater., 2005, 4, 81.Google Scholar
[3] Brinkmann, M., Graff, S., Biscarini, F., Phys. Rev. B, 2002, 66, 1654–30.Google Scholar
[4] Sirringhaus, H., Tessler, N., Friend, R.H., Science, 1998, 280, 1741.Google Scholar
[5] Gelinck, G.H., et al., Nature Mater., 2004, 3, 106.Google Scholar
[6] Burroughes, H., Bradley, D.D.C., Brown, A.R., Marks, R.N., Mackay, K., Friend, R.H., Burns, P.L., Holmes, A.B., Nature, 1990, 347, 539.Google Scholar
[7] Tang, C.W., Slyke, S.A. Van, Appl. Phys. Lett., 1987, 51, 913.Google Scholar
[8] Chabinyc, M.L., Wong, W.S., Paul, K.E., Street, R.A., Adv. Mater., 2003, 15(22), 1903.Google Scholar
[9] Brabec, C.J., Sariciftci, N.S., Hummelen, J.C., Adv. Funct. Mater., 2001, 11, 15.Google Scholar
[10] Mazzeo, M., Vitale, V., Sala, F. Della, Anni, M., Barbarella, G., Favaretto, L., Sotgiu, G., Cingolani, R., Gigli, G., Adv. Mater., 2005, 17, 34.Google Scholar
[11] Xia, Y., Whitesides, G.M., Angew. Chem. Int. Ed., 1998, 37, 550.Google Scholar
[12] Sharma, A., Langmuir, 1993, 9, 861.Google Scholar
[13] Zhao, J., Jiang, S., Wang, Q., Liu, X., Ji, X., Jiang, B., Appl. Surface Science, 2004, 236, 131.Google Scholar
[14] Viola, I., Mazzeo, M., Passabi, A., D'Amone, S., Cingolani, R., Gigli, G. Adv. Mater., 2005, 17, 2935.Google Scholar
[15] Deegan, R.D., Bakajin, O., Dupont, T.F., Huber, G., Nagel, S.R., Witten, T.A., Nature, 1997, 389, 827.Google Scholar
[16] Bowmann, C., Newell, A.C., Rev. Mod. Phys., 1998, 70, 289.Google Scholar
[17] Scheer, H.C., Schulz, H., Hoffmann, T., Torres, C.M.S., J. Vac. Sci. Technol. B, 1998, 16(6), 3917.Google Scholar
[18] Karthaus, O., Koito, T., Shimomura, M., Mater. Science and Engineering C, 1999, 8–9, 523.Google Scholar
[19] Harkema, S., Schaffer, E., Morariu, M.D., Steiner, U., Langmuir, 2003, 19, 9714.Google Scholar
[20] Maillard, M., Motte, L., Pileni, M.P., Adv. Mater., 2001, 13(3), 200.Google Scholar
[21] Gigli, G., Anni, M., Cingolani, R., Barbarella, G., Advanced Semiconductor and Organic Nano-Techniques, Chapter 5, 241–291, Morkoc, H. (Ed.) 2003, Elsevier, USA.Google Scholar
[22] Barbarella, G., Melucci, M., Sotgiu, G., Adv. Mater., 2005, 17, 1581.Google Scholar
[23] Karthaus, O., Adachi, C., Kurimura, S., Oyamada, T., Appl. Phys. Lett., 2004, 84(23), 4697.Google Scholar
[24] Cavallini, M., Lazzaroni, R., Zamboni, R., Biscarini, F., Timpel, D., Zerbetto, F., Clarkson, G., Leigh, D., J. Phys. Chem. B, 2001, 105, 10826.Google Scholar
[25] Gigli, G., Lomascolo, M., Cingolani, R., Barbarella, G., Zambianchi, M., Antolini, L., Sala, F. Della, Carlo, A. Di, Lugli, P., Appl. Phys. Lett., 1998, 73, 2414.Google Scholar
[26] Alivisatos, A.P., Science, 1996, 271, 933.Google Scholar
[27] Cicoira, F., Santato, C., Melucci, M., Favaretto, L., Gazzano, M., Muccini, M., Barbarella, G., Adv. Mater., 2006, 18, 169.Google Scholar
[28] Massi, M., Cavallini, M., Stagni, S., Palazzi, A., Biscarini, F., Mater. Science and Engineer. C, 2003, 23, 923.Google Scholar
[29] Wang, X., Ostblom, M., Johansson, T., Inganas, O., Thin Solid Films, 2004, 449, 125.Google Scholar
[30] Tedesco, E., Sala, F. Della, Favaretto, L., Barbarella, G., Albesa-Jove, D., Pisignano, D., Gigli, G., Cingolani, R., Harris, K.D.M.; J. Am. Chem. Soc., 2003, 125, 12277.Google Scholar
[31] Barbarella, G.; Zambianchi, M.; Antolini, L.; Ostoja, P.; Maccagnani, P.; Bongini, A.; Marseglia, E. A.; Tedesco, E.; Gigli, G.; Cingolani, R.; J. Am. Chem. Soc.; 1999, 121, 89208926.Google Scholar