Hostname: page-component-7479d7b7d-68ccn Total loading time: 0 Render date: 2024-07-15T19:18:27.982Z Has data issue: false hasContentIssue false

The Fabrication of Mercuric Iodide Detectors for Use in Wavelength Dispersive X-Ray Analysers and Backscatter Photon Measurements

Published online by Cambridge University Press:  15 February 2011

John H. Howes
Affiliation:
Aere Harwell, Didcot, Oxon. OXll ORA, UK.
John Watling
Affiliation:
Aere Harwell, Didcot, Oxon. OXll ORA, UK.
Get access

Abstract

This paper describes the fabrication of mercuric iodide nuclear radiation detectors suitable for X and gamma ray spectrometry at room temperature. The active area of the detectors studied are between 0.2 and 1.5cm sq and they are up to 0.5mm thick. The method of producing a stable electrical contact to the crystal using sputtered germanium has been studied. The X-ray resolution of a 1.5cm sq. area detector at 32 keV is 2.3 keV FWHM when operated at room temperature in conjunction with a time variant filter amplifier. A factor which is important in the fabrication of the detector is the surface passivation necessary to achieve a useful detector life.

This type of detector has been used on a wavelength dispersive X-ray spectrometer for energy measurements between 10 and 100 keV. The advantages over the scintillation counter, more commonly used, is the improved resolution of the HgI2 detector and its smaller size. The analyser is primarily used for the detection of low levels of heavy metals on particulate filters. The detectors have also been used on an experimental basis for gamma ray backscatter measurements in the medical field.

Type
Research Article
Copyright
Copyright © Materials Research Society 1983

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1. Newkirk, J. B., Acta Metallurgica 4, 316 (1956)Google Scholar
2. Gross, E. F., Zhur Tekh Fiz 25, 1661 (1955)Google Scholar
3. Bube, R. H., Phys. Rev. 106, No. 4, 703 (1957)Google Scholar
4. Willig, W. R. and Roth, S. Proc. of International Sym. on CdTe, authorsCornel, A. and Siffert, P., Strasbourg (1971).Google Scholar
5. Malm., H. L. IEEE Trans Nuc Sci NS 19 No.3 (1972) p 263.Google Scholar
6. Ponpon, J.P. et al. IEEE Trans Nuc Sci NS 22 (1975) p 182.Google Scholar
7. Swierkowski, A.P. et al. App. Phys. Lett. 23(1973) 281. CrossRefGoogle Scholar
8. Schieber, M. et al. IEEE Trans Nuc Sci NS21, No.6(1974) p. 305 .Google Scholar
9. Nicolau, I. F., Joly, J.P. J of Crystal Growth 48 (1980) 61.CrossRefGoogle Scholar
10. Scholz., M. Acta Elektron 17 (1974) 69.Google Scholar
11. Schieber, M., Schnepple, W.F. & Van der Berg., L. J of Crystal Growth 33(1976) 125.Google Scholar
12. , S. P. Faile et al. . J of Crystal Growth 50 (1980) 752.Google Scholar
13. Barton, J.P. et al. . Advances in X-ray Analysis, Vol 25 (1982) 30th Denver Conference.Google Scholar
14. Proc. of Workshop on HgI2 Strasbourg 1975 (Ed. Siffert, P.).Google Scholar
15. Cho, Z.H. et al. . IEEE Trans Nucl Sci NS 22 (1975) 1229.Google Scholar
16. Allsworth, F.L. et al. . Nuc. Inst ' Meths. 193 (1982) 57.CrossRefGoogle Scholar
17. Dabrowski, A. J.. Advances in X-ray Analysis Vol 25 (1982) 1.CrossRefGoogle Scholar
18. Klien, C. A., J. App Phys. Vol 39 (1968) 2029.Google Scholar
19. Schieber, M. et al. . IEEE Trans Nucl Sci. NS 24 (1977) 148.Google Scholar
20. Simon, D. S. et al. Journal of Applied Physiology Dec 1979. 1228.Google Scholar