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Fabrication and characterization of freestanding NiMnGa films

Published online by Cambridge University Press:  01 February 2011

Holger Rumpf
Affiliation:
Center of Advanced European studies and Research, Bonn, Germany
Corneliu Craciunescu
Affiliation:
Center of Advanced European studies and Research, Bonn, Germany Politehnica University of Timisoara, Romania
Jürgen Feydt
Affiliation:
Center of Advanced European studies and Research, Bonn, Germany
Achim Gilles
Affiliation:
Center of Advanced European studies and Research, Bonn, Germany
Manfred Wuttig
Affiliation:
Center of Advanced European studies and Research, Bonn, Germany Department of Materials Science, University of Maryland, College Park, MD, U.S.A.
Eckhard Quandt
Affiliation:
Center of Advanced European studies and Research, Bonn, Germany
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Abstract

Freestanding Ni50Mn30Ga20 films of 13 μm thickness were fabricated by DC magnetron sputtering and analyzed. Magnetic measurements revealed the influence of the post deposition rapid thermal annealing process on the ferromagnetic hysteresis. Ferromagnetic properties evolved after annealing at 400°C. Thermal annealing of at least 600°C led to polycrystalline films that transformed reversibly and martensitically as shown by structural analysis and differential scanning calorimetry. Transformation temperatures and enthalpies of transformation of the martensitic transformation were strongly influenced by the temperature of the rapid annealing process. It is proposed that the annealing data reflect the evolution of the crystalline state.

Type
Research Article
Copyright
Copyright © Materials Research Society 2004

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References

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