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Extracting Trap Parameters From Picts Spectra In Cadmium Zinc Telluride Radiation Detector Material

Published online by Cambridge University Press:  10 February 2011

J. E. Toney
Affiliation:
Department of Physics, Carnegie Mellon University, Pittsburgh, PA 15213
B. A. Brunett
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213
T. E. Schlesinger
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA 15213
R. B. James
Affiliation:
Sandia National Laboratories, Livermore, CA 94550
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Abstract

We demonstrate that the regularization method due to Weese can resolve closely-spaced peaks in PICTS spectra for cadmium zinc telluride. We also show that electron and hole traps can be distinguished from each other by the bias dependence of the spectrum when using an excitation source that is primarily infrared but which contains a small component of visible light. Lastly we show that there are qualitative differences between PICTS spectra taken with infrared excitation and those taken with visible excitation. We attribute the surface-related levels to diffusion into the detector material of gold from electroless deposition of contacts.

Type
Research Article
Copyright
Copyright © Materials Research Society 1998

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